Altering a pseudo-random bit sequence for scan-based BIST

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 167-175

  Touba, Nur A ^a   McCluskey, Edward J ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FAULT CURRENTS; LOGIC CIRCUITS; LOGIC DESIGN; SHIFT REGISTERS;

BUILT IN SELF TEST (BIST); EMBEDDED SYSTEMS; LINEAR FEEDBACK SHIFT REGISTER (LFSR);

INTEGRATED CIRCUIT TESTING;

EID: 0030388310     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (21)