Bit-flipping BIST

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 1996, Pages 337-343

  Wunderlich, Hans Joachim ^a   Kiefer, Gundoff ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; INTEGRATED CIRCUIT TESTING; PROBABILITY; SHIFT REGISTERS;

BUILT IN SELF TEST (BIST); LINEAR FEEDBACK SHIFT REGISTERS (LFSR);

COMBINATORIAL CIRCUITS;

EID: 0030408584     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (25)