Extended frequency-directed run-length code with improved application to System-on-a-chip test data compression

Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems

Volumn 2, Issue , 2002, Pages 449-452

  El Maleh, Aiman H ^a   Al Abaji, Raslan H ^a  

^a KING FAHD UNIVERSITY OF PETROLEUM AND MINERALS   (Saudi Arabia)

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSION RATIOS; RUN LENGTH; RUN LENGTH CODES; RUN-LENGTH CODE; SYSTEM-ON-A-CHIP; SYSTEM-ON-A-CHIP TEST; TEST DATA; TEST DATA COMPRESSION;

APPLICATION SPECIFIC INTEGRATED CIRCUITS; ENCODING (SYMBOLS); PROGRAMMABLE LOGIC CONTROLLERS; TESTING;

DATA COMPRESSION;

EID: 77956428048     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICECS.2002.1046192     Document Type: Conference Paper

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