A technique for high ratio LZW compression

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2003, Pages 116-121

  Knieser, Michael J ^a   Wolff, Francis G ^b   Papachristou, Chris A ^b   Weyer, Daniel J ^c   McIntyre, David R ^d  

^a INDIANA UNIVERSITY   (United States)

^b CASE WESTERN RESERVE UNIVERSITY   (United States)

^c CISCO SYSTEMS   (United States)

^d CLEVELAND STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DON'T-CARES; DOWNLOAD TIME; EMBEDDED MEMORY; HIGH COMPRESSION RATIO; LZW ALGORITHMS; SCAN TESTS; SYSTEM-ON-A-CHIP DESIGNS; TEST VECTORS;

APPLICATION SPECIFIC INTEGRATED CIRCUITS; COMPRESSION RATIO (MACHINERY); DESIGN; EXHIBITIONS;

TESTING;

EID: 48349096067     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2003.1253596     Document Type: Conference Paper

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