Stress-induced depolarization in PZT thin films, measured by means of electric force microscopy

Surface Science

Volumn 416, Issue 1-2, 1998, Pages 59-67

  Franke, K ^b   Huelz, H ^a,b   Weihnacht, M ^b  

^a Kodak AG   (Germany)

^b IFW DRESDEN   (Germany)

Author keywords

Atomic force microscopy; Depolarization effects (dielectrics); Ferroelasticity; Hysteresis ferroelectricity; Polarization dielectric; Thin films dielectric

Indexed keywords

ATOMIC FORCE MICROSCOPY; FERROELECTRIC MATERIALS; LEAD COMPOUNDS; POLARIZATION; TITANIUM DIOXIDE;

DEPOLARIZATION; ELECTRIC SCANNING FORCE MICROSCOPES; PZT FILMS;

THIN FILMS;

EID: 0032179254     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00500-7     Document Type: Article

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