Tapping mode atomic force microscopy using electrostatic force modulation

Applied Physics Letters

Volumn 69, Issue 19, 1996, Pages 2831-2833

  Hong, J W ^a   Khim, Z G ^a   Hou, A S ^b   Park, Sang Il ^b  

^a Seoul National University   (South Korea)

^b Park Scientific Instruments   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001481534     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117333     Document Type: Article

References (12)

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11. Polystyrene microsphere particle supplied by Duke Scientific Corp.
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