|
Volumn 76, Issue 22, 1996, Pages 4291-
|
Comment on “nanoscale visualization and control of ferroelectric domains by atomic force microscopy”
a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
|
EID: 5944252964
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.76.4291 Document Type: Note |
Times cited : (9)
|
References (5)
|