Characterization of ferroelectric lead zirconate titanate films by scanning force microscopy

Journal of Applied Physics

Volumn 81, Issue 11, 1997, Pages 7480-7491

  Zavala, Genaro ^a   Fendler, Janos H ^a   Trolier McKinstry, Susan ^b  

^a SYRACUSE UNIVERSITY   (United States)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; ELECTRIC CONTACTS; ELECTRIC VARIABLES MEASUREMENT; FERROELECTRIC MATERIALS; FRICTION; HARMONIC GENERATION; MICROSCOPIC EXAMINATION; PERMITTIVITY; PHASE TRANSITIONS; PIEZOELECTRICITY; POLARIZATION; SPECTROSCOPIC ANALYSIS;

FRICTION FORCE MICROSCOPY; LEAD ZIRCONATE TITANATE; POINT SPECTROSCOPY; SCANNING FORCE MICROSCOPY;

LEAD COMPOUNDS;

EID: 0031162755     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365350     Document Type: Article

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