Study of electrostatic properties of dielectric surfaces and powders using scanning probe microscopy

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Volumn 2, Issue , 1999, Pages 748-755

  Machowski, W ^a   Baird, P ^a   Balachandran, W ^a  

^a BRUNEL UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIELECTRIC PROPERTIES OF SOLIDS; ORGANIC POLYMERS; POWDERS; SILICONES; SURFACE PROPERTIES; SURFACE TOPOGRAPHY;

POLYBUTYLTERAPHTALATE; SCANNING PROBE MICROSCOPY;

ELECTROSTATICS;

EID: 0033332908     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)