Electrostatic force microscopy of silver nanocrystals with nanometer-scale resolution

Applied Physics Letters

Volumn 71, Issue 13, 1997, Pages 1878-1880

  Nyffenegger, Ralph M ^a   Penner, Reginald M ^a   Schierle, Rainer ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Park Scientific Instruments   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000782662     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119425     Document Type: Article

References (10)

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