Proximity effects of negative charge groups contact-electrified on thin silicon oxide in air

Journal of Applied Physics

Volumn 79, Issue 8, 1996, Pages 4174-4177

  Uchihashi, Takayuki ^a   Okusako, Takahiro ^a   Sugawara, Yasuhiro ^a   Yamanishi, Yoshiki ^b   Oasa, Takahiko ^b   Morita, Seizo ^a  

^a HIROSHIMA UNIVERSITY   (Japan)

^b Sumitomo Metal Industries Limited   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004339429     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361784     Document Type: Article

References (13)

1. B. D. Terris, J. E. Stern. D. Rugar, and H. J. Mamin, Phys. Rev. Lett. 63, 2669 (1989).
2. C. Schönenberger, Phys. Rev. B 45, 3861 (1992).
3. R. Erlandsson, G. M. McClelland, C. M. Mate, and S. Chiang, J. Vac. Sci. Technol. A 6, 266 (1988).
4. J. E. Stern, B. D. Terris, H. J. Mamin, and D. Rugar, Appl. Phys. Lett. 53, 2717 (1988).
5. C. Schönenberger and S. F. Alvarado, Phys. Rev. Lett. 65, 3162 (1990).
6. F. Saurenbach and B. D. Terris, IEEE Trans. Ind. Appl. 28, 256 (1992).
7. S. Morita, Y. Fukano, T. Uchihashi, T. Okusako, Y. Sugawara, Y. Yamanishi, and T. Oasa, Jpn. J. Appl. Phys. 32, L1701 (1993).
8. S. Morita, Y. Sugawara, Y. Fukano, T. Uchihashi, T. Okusako, A. Chayahara, Y. Yamanishi, and T. Oasa, Jpn. J. Appl. Phys. 32, L1852 (1993).
9. Y. Sugawara, S. Morita, Y. Fukano, T. Uchihashi, T. Okusako, A. Chayahara, Y. Yamanishi, and T. Oasa, Jpn. J. Appl. Phys. 33, L70 (1994).
10. T. Okusako, T. Uchihashi, A. Nakano, T. Ida, Y. Sugawara, and S. Morita, Jpn. J. Appl. Phys. 33, L959 (1994).
11. T. Tsuyuguchi, T. Uchihashi, T. Okusako, Y Sugawara, S. Morita, Y. Yamanishi, and T. Oasa, Jpn. J. Appl. Phys. 33, L1046 (1994).
12. T. Uchihashi, T. Okusako, Y. Sugawara, S. Morita, Y. Yamanishi, and T. Oasa, Jpn. J. Appl. Phys. 33, L1128 (1994).
13. Y. Fukano, T. Uchihashi, T. Okusako, A. Chayahara, Y. Sugawara, S. Morita, Y. Yamanishi, and T. Oasa, Jpn. J. Appl. Phys. 33, 6739 (1994).