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Materials Science and Engineering B: Solid-State Materials for Advanced Technology

Volumn 69, Issue , 2000, Pages 289-294

Electronic properties of single semiconductor nanocrystals: Optical and electrostatic force microscopy measurements

(2) Krauss, Todd D a Brus, Louis E a

a Columbia University ^* (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATICS; OPTICAL MICROSCOPY; PARTIAL DISCHARGES; PERMITTIVITY; PHOTOIONIZATION; POLARIZATION; SEMICONDUCTING CADMIUM COMPOUNDS; SPECTROSCOPIC ANALYSIS; SYNTHESIS (CHEMICAL);

ELECTROSTATIC MICROSCOPY; SEMICONDUCTOR NANOCRYSTALS;

NANOSTRUCTURED MATERIALS;

EID: 0033896451 PISSN: 09215107 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-5107(99)00407-9 Document Type: Article

Times cited : (24)

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