Overview of on-chip electrostatic discharge protection design with SCR-based devices in CMOS integrated circuits

IEEE Transactions on Device and Materials Reliability

Volumn 5, Issue 2, 2005, Pages 235-249

  Ker, Ming Dou ^a   Hsu, Kuo Chun ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

Electrostatic discharge (ESD); ESD protection circuits; Latchup; Silicon controlled rectifier (SCR)

Indexed keywords

AVALANCHE DIODES; BUFFER CIRCUITS; CMOS INTEGRATED CIRCUITS; FLIP FLOP CIRCUITS; MATHEMATICAL MODELS; ROBUSTNESS (CONTROL SYSTEMS); THYRISTORS; TRANSISTORS;

ELECTROSTATIC DISCHARGE (ESD); ESD PROTECTION CIRCUITS; LATCHUP; SILICON CONTROLLED RECTIFIER (SCR);

ELECTROSTATICS;

EID: 23844554205     PISSN: 15304388     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDMR.2005.846824     Document Type: Conference Paper

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