Unique ESD failure mechanisms during negative to Vcc HBM tests

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1997, Pages 346-355

  Chaine, Michael ^a   Smith, Scott ^a   Bui, Anh ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC DISCHARGES; ELECTROSTATICS;

DYNAMIC RANDOM ACCESS MEMORY (DRAM); ELECTROSTATIC DISCHARGE (ESD) PROTECTION CIRCUITS; HUMAN BODY MODELS (HBM);

RANDOM ACCESS STORAGE;

EID: 0031371986     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)