Complementary-LVTSCR ESD protection circuit for submicron CMOS VLSI/ULSI

IEEE Transactions on Electron Devices

Volumn 43, Issue 4, 1996, Pages 588-598

  Ker, Ming Dou ^a   Wu, Chung Yu ^a   Chang, Hun Hsien ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ACCIDENT PREVENTION; ELECTRIC BREAKDOWN; ELECTRIC DISCHARGES; ELECTRIC LINES; HIGH TEMPERATURE EFFECTS; INTEGRATED CIRCUIT LAYOUT; MOS DEVICES; PROTECTION; THYRISTORS; VLSI CIRCUITS;

ELECTROSTATIC DISCHARGE; LOW VOLTAGE TRIGGER SILICON CONTROLLED RECTIFIERS; NMOS DEVICES; PMOS DEVICE; TRIGGER VOLTAGES;

CMOS INTEGRATED CIRCUITS;

EID: 0030128946     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.1996.1210725     Document Type: Article

References (15)

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