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Volumn 2002-January, Issue , 2002, Pages 10-17

High Holding Current SCRs (HHI-SCR) for ESD protection and latch-up immune IC operation

Author keywords

Anodes; Breakdown voltage; Circuits; Clamps; Dynamic voltage scaling; Electrostatic discharge; Europe; MOS devices; Protection; Thyristors

Indexed keywords

ANODES; BICMOS TECHNOLOGY; CLAMPING DEVICES; ELECTRIC BREAKDOWN; ELECTRIC POWER SYSTEM PROTECTION; ELECTROSTATIC DEVICES; ELECTROSTATIC DISCHARGE; MOS DEVICES; NETWORKS (CIRCUITS); THYRISTORS; VOLTAGE SCALING;

EID: 84875290566     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (41)

References (14)
  • 1
    • 84948982831 scopus 로고    scopus 로고
    • GGSCRs: GGNMOS Triggered Silicon Controlled Rectifiers for ESD Protection in Deep Sub-Micron CMOS Processes
    • C. Russ, M. Mergens, K. Verhaege, J. Armer, P. Jozwiak, G. Kolluri, and L. Avery, "GGSCRs: GGNMOS Triggered Silicon Controlled Rectifiers for ESD Protection in Deep Sub-Micron CMOS Processes," EOS/ESD 2001, pp. 22.
    • EOS/ESD 2001 , pp. 22
    • Russ, C.1    Mergens, M.2    Verhaege, K.3    Armer, J.4    Jozwiak, P.5    Kolluri, G.6    Avery, L.7
  • 2
    • 0021629272 scopus 로고    scopus 로고
    • Using SCRs as Transient Protection Structures in Integrated Circuits
    • L. R. Avery, "Using SCRs as Transient Protection Structures in Integrated Circuits," EOS/ESD 1983, pp. 177.
    • EOS/ESD 1983 , pp. 177
    • Avery, L.R.1
  • 5
    • 0028732945 scopus 로고    scopus 로고
    • Bi-Modal Triggering for LVSCR ESD Protection Devices
    • C. Diaz and G. Motley, "Bi-Modal Triggering for LVSCR ESD Protection Devices," EOS/ESD 1994, pp. 106.
    • EOS/ESD 1994 , pp. 106
    • Diaz, C.1    Motley, G.2
  • 7
    • 0034538958 scopus 로고    scopus 로고
    • Breakdown and Latent Damage of Ultra-Thin Gate Oxides under ESD Stress Conditions
    • J. Wu, P. Juliano, and E. Rosenbaum. "Breakdown and Latent Damage of Ultra-Thin Gate Oxides under ESD Stress Conditions," EOS/ESD 2000, pp. 287.
    • EOS/ESD 2000 , pp. 287
    • Wu, J.1    Juliano, P.2    Rosenbaum, E.3
  • 8
    • 0032309711 scopus 로고    scopus 로고
    • How to Safely Apply the LVTSCR for CMOS Whole-Chip Protection without being Accidentally Triggered On
    • M.D. Ker and H. Chang, "How to Safely Apply the LVTSCR for CMOS Whole-Chip Protection without being Accidentally Triggered On," EOS/ESD 1998, pp. 72.
    • EOS/ESD 1998 , pp. 72
    • Ker, M.D.1    Chang, H.2
  • 9
    • 0031207022 scopus 로고    scopus 로고
    • ESD protection for CMOS output buffer by using modified LVTSCR devices with high trigger current
    • M.-D. Ker, "ESD protection for CMOS output buffer by using modified LVTSCR devices with high trigger current," IEEE Solid-State Circuits, Vol.32, No.8, pp. 1293, 1997.
    • (1997) IEEE Solid-State Circuits , vol.32 , Issue.8 , pp. 1293
    • Ker, M.-D.1
  • 10
    • 0011003950 scopus 로고    scopus 로고
    • Lateral SCR Devices with Low-Voltage High-Current triggering Characteristics for Output ESD Protection in Sub-micron CMOS Technology
    • M.-D. Ker, "Lateral SCR Devices with Low-Voltage High-Current triggering Characteristics for Output ESD Protection in Sub-micron CMOS Technology," IEEE Trans. Electron Devices, Vol. 45, No.4, pp. 849, 1998.
    • (1998) IEEE Trans. Electron Devices , vol.45 , Issue.4 , pp. 849
    • Ker, M.-D.1
  • 11
    • 0027883867 scopus 로고    scopus 로고
    • ESD Protection of BiCMOS Integrated Circuits, which Need to Operate in the Harsh Environments of Automotive or Industrial
    • M. Corsi, R. Nimmo, and F. Fattori, "ESD Protection of BiCMOS Integrated Circuits, which Need to Operate in the Harsh Environments of Automotive or Industrial," EOS/ESD 1993, pp. 209.
    • EOS/ESD 1993 , pp. 209
    • Corsi, M.1    Nimmo, R.2    Fattori, F.3
  • 12
    • 0031249221 scopus 로고    scopus 로고
    • Using an SCR as ESD Protection without Latch-up Danger
    • G. Notermans, F. Kuper, and J-M. Luchis, "Using an SCR as ESD Protection without Latch-up Danger," Microelect. Reliab., Vol.37, No. 10/11, pp.1457, 1997.
    • (1997) Microelect. Reliab. , vol.37 , Issue.10-11 , pp. 1457
    • Notermans, G.1    Kuper, F.2    Luchis, J.-M.3
  • 14


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.