SCR device with double-triggered technique for on-chip ESD protection in sub-quarter-micron silicided CMOS processes

IEEE Transactions on Device and Materials Reliability

Volumn 3, Issue 3, 2003, Pages 58-68

  Ker, Ming Dou ^a   Hsu, Kuo Chun ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

Double triggered technique; Electrostatic discharge (ESD); ESD protection circuit; Silicon controlled rectifier (SCR)

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC DISCHARGES; ELECTRIC RECTIFIERS; ELECTROSTATICS; GATES (TRANSISTOR); MICROPROCESSOR CHIPS; SILICON; SWITCHING;

DOUBLE-TRIGGERED TECHNIQUE; ELECTROSTATIC DISCHARGES (ESD); ESD PROTECTION CIRCUITS; SILICON-CONTROLLED RECTIFIERS (SCR);

CMOS INTEGRATED CIRCUITS;

EID: 3042562496     PISSN: 15304388     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDMR.2003.815192     Document Type: Article

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