Strain relaxation in (0001) AlN/GaN heterostructures

Physical Review B - Condensed Matter and Materials Physics

Volumn 63, Issue 24, 2001, Pages

  Bourret, Alain ^a   Adelmann, Christoph ^a   Daudin, Bruno ^a   Rouvière, Jean Luc ^a   Feuillet, Guy ^a   Mula, Guido ^b  

^a Service des Matériaux et Microstructures Grenoble   (France)

^b UNIVERSITY OF CAGLIARI   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM DERIVATIVE; GALLIUM; NITROGEN DERIVATIVE;

ARTICLE; ATOMIC FORCE MICROSCOPY; DENSITY; ELECTRON DIFFRACTION; IMAGE ANALYSIS; PARAMETER; STRESS; STRESS STRAIN RELATIONSHIP; STRUCTURE ANALYSIS; TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0034906466     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.63.245307     Document Type: Article

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