Atomic and chemical resolution in scanning force microscopy on ionic surfaces

Applied Surface Science

Volumn 141, Issue 3-4, 1999, Pages 274-286

  Livshits, Alexander I ^a   Shluger, Alexander L ^a  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

Author keywords

34.20.Cf; 61.16.Ch; 68.35.Bs; 78.55.Fv; 85.42+m; APN; Ionic crystals; Scanning force microscopy; Theory; Tip surface interaction

Indexed keywords

EID: 0005305969     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00513-3     Document Type: Article

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