Tip-surface interactions studied using a force controlled atomic force microscope in ultrahigh vacuum

Applied Physics Letters

Volumn 70, Issue 17, 1997, Pages 2238-2240

  Jarvis, S P ^a   Yamamoto, S I ^a   Yamada, H ^b   Tokumoto, H ^b   Pethica, J B ^c  

^a JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

^b NATL INST FOR ADV INTERDISC RES   (Japan)

^c UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001610115     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118826     Document Type: Article

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