Study of the surface of ice, ice/solid and ice/liquid interfaces with scanning force microscopy

Journal of Physical Chemistry B

Volumn 101, Issue 32, 1997, Pages 6276-6281

  Petrenko, Victor F ^a  

^a DARTMOUTH COLLEGE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; CARRIER CONCENTRATION; ELECTRIC CHARGE; ICE; INTERFACIAL ENERGY; LOW TEMPERATURE EFFECTS; MASS TRANSFER; MICROSCOPIC EXAMINATION; MORPHOLOGY; PHYSICAL PROPERTIES; SILICON; SILICON NITRIDE;

ADHESION STRENGTH; SCANNING FORCE MICROSCOPY (SFM);

PHASE INTERFACES;

EID: 0031558358     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp963217h     Document Type: Article

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