-
1
-
-
36549104917
-
Calculation of surface generation and recombination velocities at the Si-SiO2 interface
-
Eades, W.D., Swanson, R.M.: Calculation of surface generation and recombination velocities at the Si-SiO2 interface. J. Appl. Phys. 58, 4267–4276 (1985)
-
(1985)
J. Appl. Phys.
, vol.58
, pp. 4267-4276
-
-
Eades, W.D.1
Swanson, R.M.2
-
2
-
-
52949151913
-
Passivation of structured p-type silicon interfaces: Effect of surface morphology and wet-chemical pre-treatment
-
Angermann, H.: Passivation of structured p-type silicon interfaces: Effect of surface morphology and wet-chemical pre-treatment. Appl. Surf. Sci. 254, 8067–8074 (2008)
-
(2008)
Appl. Surf. Sci.
, vol.254
, pp. 8067-8074
-
-
Angermann, H.1
-
3
-
-
84929177658
-
Infrared spectroscopy of Si(111) and Si(100) surfaces after HF treatment: Hydrogen termination and surface morphology
-
Chabal, Y.J., Higashi, G.S., Raghavachari, K., Burrows, V.A.: Infrared spectroscopy of Si(111) and Si(100) surfaces after HF treatment: Hydrogen termination and surface morphology. J. Vac. Sci. Technol. A 7, 2104–2109 (1989)
-
(1989)
J. Vac. Sci. Technol. A
, vol.7
, pp. 2104-2109
-
-
Chabal, Y.J.1
Higashi, G.S.2
Raghavachari, K.3
Burrows, V.A.4
-
4
-
-
54249110557
-
Recombination behaviour at the ultrathin polypyrrole film/silicon interface investigated by in-situ pulsed photoluminescence
-
Intelmann, C.M., Hinrichs, K., Syritski, V., Yang, F., Rappich, J.: Recombination behaviour at the ultrathin polypyrrole film/silicon interface investigated by in-situ pulsed photoluminescence. Japanese Journal of Applied Physics, Part I: Regular Papers and Short Notes 47, 554–557 (2008)
-
(2008)
Japanese Journal of Applied Physics, Part I: Regular Papers and Short Notes
, vol.47
, pp. 554-557
-
-
Intelmann, C.M.1
Hinrichs, K.2
Syritski, V.3
Yang, F.4
Rappich, J.5
-
5
-
-
85126641236
-
Nonradiative recombination and band bending of p-Si(100) surface
-
Rappich, J., Fahoume, M.: Nonradiative recombination and band bending of p-Si(100) surface. Thin Solid Films (2005)
-
(2005)
Thin Solid Films
-
-
Rappich, J.1
Fahoume, M.2
-
7
-
-
33748296164
-
Chemical and Electrical Passivation of Single-Crystal Silicon(100) Surfaces through a Two-Step Chlorination/Alkylation Process
-
Nemanick, E.J., Hurley, P.T., Webb, L.J., Knapp, D.W., Michalak, D.J., Brunschwig, B.S., Lewis, N.S.: Chemical and Electrical Passivation of Single-Crystal Silicon(100) Surfaces through a Two-Step Chlorination/Alkylation Process. J. Phys. Chem. B 110, 14770–14778 (2006)
-
(2006)
J. Phys. Chem. B
, vol.110
, pp. 14770-14778
-
-
Nemanick, E.J.1
Hurley, P.T.2
Webb, L.J.3
Knapp, D.W.4
Michalak, D.J.5
Brunschwig, B.S.6
Lewis, N.S.7
-
9
-
-
64649083109
-
Optimization of KOH etching process to obtain textured substrates suitable for heterojunction solar cells fabricated by HWCVD
-
Munoz, D., Carreras, P., Escarre, J., Ibarz, D., Martin de Nicolas, S., Voc, C., Asensi, J.M., Bertomeu, J.: Optimization of KOH etching process to obtain textured substrates suitable for heterojunction solar cells fabricated by HWCVD. Thin Solid Films 517, 3578 (2009)
-
(2009)
Thin Solid Films
, vol.517
, pp. 3578
-
-
Munoz, D.1
Carreras, P.2
Escarre, J.3
Ibarz, D.4
Martin de Nicolas, S.5
Voc, C.6
Asensi, J.M.7
Bertomeu, J.8
-
10
-
-
2942687785
-
Alkaline etching for reflectance reduction in multicrystalline silicon solar cells
-
Hylton, J.D., Burgers, A.R., Sinke, W.C.: Alkaline etching for reflectance reduction in multicrystalline silicon solar cells. J. Electrochem. Soc. 151, 408 (2004)
-
(2004)
J. Electrochem. Soc.
, vol.151
, Issue.408
-
-
Hylton, J.D.1
Burgers, A.R.2
Sinke, W.C.3
-
11
-
-
33747222406
-
The effect of H2SiF6 on the surface morphology of textured multi-crystalline silicon
-
Weinreich, W., Acker, J., Gräber, I.: The effect of H2SiF6 on the surface morphology of textured multi-crystalline silicon. Semicond. Sci. Technol. 21, 1278–1286 (2006)
-
(2006)
Semicond. Sci. Technol.
, vol.21
, pp. 1278-1286
-
-
Weinreich, W.1
Acker, J.2
Gräber, I.3
-
12
-
-
65149084584
-
Wafer Thinning Products
-
Sievert, W.J., Zimmermann, K.-U., Starzynski, J.S.: Wafer Thinning Products. European Semiconductor 27, 17 (2005)
-
(2005)
European Semiconductor
, vol.27
, pp. 17
-
-
Sievert, W.J.1
Zimmermann, K.-U.2
Starzynski, J.S.3
-
13
-
-
0025445393
-
The Evolution of Silicon Wafer Cleaning Technology
-
Kern, W.: The Evolution of Silicon Wafer Cleaning Technology. J. Electrochem. Soc. 137, 1887 (1990)
-
(1990)
J. Electrochem. Soc.
, vol.137
, pp. 1887
-
-
Kern, W.1
-
14
-
-
0032000538
-
H-terminated silicon: Spectroscopic ellipsometry measurements correlated to the surface electronic properties
-
Angermann, H., Henrion, W., Rebien, M., Fischer, D., Zettler, J.-T., Röseler, A.: H-terminated silicon: spectroscopic ellipsometry measurements correlated to the surface electronic properties. Thin Solid Films 313-314, 552–556 (1998)
-
(1998)
Thin Solid Films
, vol.313-314
, pp. 552-556
-
-
Angermann, H.1
Henrion, W.2
Rebien, M.3
Fischer, D.4
Zettler, J.-T.5
Röseler, A.6
-
15
-
-
50249084391
-
Ultrathin SiO2 layer on atomically flat Si(111) surfaces with excellent electrical characteristics formed by nitric acid oxidation method
-
Kim, W.-B., Matsomoto, T., Kobayashi, H.: Ultrathin SiO2 layer on atomically flat Si(111) surfaces with excellent electrical characteristics formed by nitric acid oxidation method. Appl. Phys. Lett. 93, 072101–072103 (2008)
-
(2008)
Appl. Phys. Lett.
, vol.93
, pp. 072101-072103
-
-
Kim, W.-B.1
Matsomoto, T.2
Kobayashi, H.3
-
16
-
-
0031075793
-
In Situ Monitoring of Electrochemical Processes at the (100) p-Si/Aqueous NH4F Electrolyte Interface by Photoluminescence
-
Rappich, J., Timoshenko, V.Y., Dittrich, T.: In Situ Monitoring of Electrochemical Processes at the (100) p-Si/Aqueous NH4F Electrolyte Interface by Photoluminescence. J. Electrochem. Soc. 144, 493–496 (1997)
-
(1997)
J. Electrochem. Soc.
, vol.144
, pp. 493-496
-
-
Rappich, J.1
Timoshenko, V.Y.2
Dittrich, T.3
-
17
-
-
0032607992
-
Quantitative analysis of room temperature photoluminescence of c-Si wafers excited by short laser pulses
-
Timoshenko, V.Y., Petrenko, A.B., Stolyarov, M.N., Dittrich, T., Fuessel, W., Rappich, J.: Quantitative analysis of room temperature photoluminescence of c-Si wafers excited by short laser pulses. Journal of Applied Physics 85, 4171–4175 (1999)
-
(1999)
Journal of Applied Physics
, vol.85
, pp. 4171-4175
-
-
Timoshenko, V.Y.1
Petrenko, A.B.2
Stolyarov, M.N.3
Dittrich, T.4
Fuessel, W.5
Rappich, J.6
-
18
-
-
0001729860
-
Experimentelle Technik der
-
Heilig, K.: Experimentelle Technik der Physik 14, 135 (1968)
-
(1968)
Physik
, vol.14
, pp. 135
-
-
Heilig, K.1
-
19
-
-
0028712450
-
Surface electronic properties of electrolytically hydrogen terminated Si(111)
-
Dittrich, T., Bitzer, T., Angermann, H., Flietner, H., Lewerenz, H.J.: Surface electronic properties of electrolytically hydrogen terminated Si(111). J. Electrochem. Soc. 141, 3595 (1994)
-
(1994)
J. Electrochem. Soc.
, vol.141
, pp. 3595
-
-
Dittrich, T.1
Bitzer, T.2
Angermann, H.3
Flietner, H.4
Lewerenz, H.J.5
-
20
-
-
0036460360
-
Characterisation of wet-chemically treated silicon interfaces by surface photo-voltage measurements
-
Angermann, H.: Characterisation of wet-chemically treated silicon interfaces by surface photo-voltage measurements. Anal. Bioanal. Chem. 374, 676 (2002)
-
(2002)
Anal. Bioanal. Chem.
, vol.374
, pp. 676
-
-
H, A.1
-
21
-
-
57049153986
-
Detailed analysis of the microwavedetected photoconductance decay in crystalline silicon
-
Lauer, K., Laades, A., Übensee, H., Metzner, H., Lawerenz, A.: Detailed analysis of the microwavedetected photoconductance decay in crystalline silicon. J. Appl. Phys. 104, 104503 (2008)
-
(2008)
J. Appl. Phys.
, vol.104
-
-
Lauer, K.1
Laades, A.2
Übensee, H.3
Metzner, H.4
Lawerenz, A.5
-
22
-
-
85126709496
-
-
Laades, A., Brauer, J., Stürzebecher, U., Neckermann, K., Klimm, K., Blech, M., Lauer, K., Lawerenz, A., Angermann, H.: Wet-chemical treatment of solar grade CZ silicon prior to surface passivation. In: 24th European Solar Conference, Hamburg, Germany (2009) 2CV.2.61
-
Laades, A., Brauer, J., Stürzebecher, U., Neckermann, K., Klimm, K., Blech, M., Lauer, K., Lawerenz, A., Angermann, H.: Wet-chemical treatment of solar grade CZ silicon prior to surface passivation. In: 24th European Solar Conference, Hamburg, Germany (2009) 2CV.2.61
-
-
-
-
23
-
-
0000513411
-
Contactless Determination of Curent-Voltage Characteristics and Minority-Carrier Lifetimes in Semiconductors from Quasi-Steady-State Photoconductance Data
-
Sinton, R.A., Cuevas, A.: Contactless Determination of Curent-Voltage Characteristics and Minority-Carrier Lifetimes in Semiconductors from Quasi-Steady-State Photoconductance Data. Appl. Phys. Lett. 69, 2510–2512 (1996)
-
(1996)
Appl. Phys. Lett.
, vol.69
, pp. 2510-2512
-
-
Sinton, R.A.1
Cuevas, A.2
-
24
-
-
0343557383
-
Charge-carrier kinetics in semiconductors by microwave conductivity measurements
-
Swiatkowski, C., Sanders, A., Buhre, K.-D., Kunst, M.: Charge-carrier kinetics in semiconductors by microwave conductivity measurements. J. Appl. Phys. 78, 1763 (1995)
-
(1995)
J. Appl. Phys.
, vol.78
, pp. 1763
-
-
Swiatkowski, C.1
Sanders, A.2
Buhre, K.-D.3
Kunst, M.4
-
25
-
-
0037203087
-
Spectroscopic Investigations of Hydrogen Termination, Oxide Coverage, Roughness, and Surface State Density of Silicon During Native Oxidation in Air
-
Henrion, W., Rebien, M., Angermann, H., Röseler, A.: Spectroscopic Investigations of Hydrogen Termination, Oxide Coverage, Roughness, and Surface State Density of Silicon During Native Oxidation in Air. Appl. Surf. Sci. 202, 199 (2002)
-
(2002)
Appl. Surf. Sci.
, vol.202
, pp. 199
-
-
Henrion, W.1
Rebien, M.2
Angermann, H.3
Röseler, A.4
-
26
-
-
0032594884
-
Application of UV-VIS and FTIR Spectroscopic Ellipsometry to the Characterization of Wet-Chemically Treated Si Surfaces
-
Henrion, W., Röseler, A., Angermann, H., Rebien, M.: Application of UV-VIS and FTIR Spectroscopic Ellipsometry to the Characterization of Wet-Chemically Treated Si Surfaces. Phys. Stat. Sol. (a) 175, 121 (1999)
-
(1999)
Phys. Stat. Sol. (A)
, vol.175
, pp. 121
-
-
Henrion, W.1
Röseler, A.2
Angermann, H.3
Rebien, M.4
-
27
-
-
0012181591
-
Method for reduction of hysteresis effects in MIS measurements
-
Heilig, K.: Method for reduction of hysteresis effects in MIS measurements. Solid State Electron. 27, 395–396 (1984)
-
(1984)
Solid State Electron
, vol.27
, pp. 395-396
-
-
Heilig, K.1
-
28
-
-
0040365643
-
Surface-state density and surface potential in MIS capacitors by surface photovoltage measurements. I
-
Lam, Y.W.: Surface-state density and surface potential in MIS capacitors by surface photovoltage measurements. I. J. Phys. D: Appl. Phys. 4, 1370–1375 (1971)
-
(1971)
J. Phys. D: Appl. Phys.
, vol.4
, pp. 1370-1375
-
-
Lam, Y.W.1
-
29
-
-
75849155823
-
Passivation of Si surfaces investigated by in-situ photoluminescence techniques
-
Rappich, J., Zhang, X., Rosu, D.M., Schade, U., Hinrichs, K.: Passivation of Si surfaces investigated by in-situ photoluminescence techniques. Solid State Phenomena 156-158, 363–368 (2010)
-
(2010)
Solid State Phenomena
, vol.156-158
, pp. 363-368
-
-
Rappich, J.1
Zhang, X.2
Rosu, D.M.3
Schade, U.4
Hinrichs, K.5
-
30
-
-
77954328437
-
Passivation of Si surfaces by hydrogen and organic molecules investigated by in-situ photoluminescence techniques
-
Rappich, J., Zhang, X., Chapel, S., Sun, G., Hinrichs, K.: Passivation of Si surfaces by hydrogen and organic molecules investigated by in-situ photoluminescence techniques. Phys. Stat. Solidi. (c) 7, 161 (2010)
-
(2010)
Phys. Stat. Solidi. (C)
, vol.7
, Issue.161
-
-
Rappich, J.1
Zhang, X.2
Chapel, S.3
Sun, G.4
Hinrichs, K.5
-
31
-
-
0001408323
-
Optical response of microscopically rough surfaces
-
Aspnes, D.E.: Optical response of microscopically rough surfaces. Phys. Rev. B 41, 10334–10343 (1990)
-
(1990)
Phys. Rev. B
, vol.41
, pp. 10334-10343
-
-
Aspnes, D.E.1
-
32
-
-
84980703555
-
Berechnung verschiedener physikalischer Konstanten von hete-rogenen Substanzen
-
Bruggeman, D.A.G.: Berechnung verschiedener physikalischer Konstanten von hete-rogenen Substanzen. Annalen der Physik 5, 636 (1935)
-
(1935)
Annalen Der Physik
, vol.5
, pp. 636
-
-
Bruggeman, D.A.G.1
-
33
-
-
0028545819
-
Optical-standard surfaces of single-crystal silicon for calibrating ellipsometers and reflectometers
-
Yasuda, T., Aspnes, D.E.: Optical-standard surfaces of single-crystal silicon for calibrating ellipsometers and reflectometers. Appl. Opt. 33, 7435–7438 (1994)
-
(1994)
Appl. Opt.
, vol.33
, pp. 7435-7438
-
-
Yasuda, T.1
Aspnes, D.E.2
-
34
-
-
0018986239
-
Studies of surface, thin film and interface properties by automatic spectroscopic ellipsometry
-
Aspnes, D.E.: Studies of surface, thin film and interface properties by automatic spectroscopic ellipsometry. J. Vac. Sci. Technol. 18, 289–295 (1981)
-
(1981)
J. Vac. Sci. Technol.
, vol.18
, pp. 289-295
-
-
Aspnes, D.E.1
-
35
-
-
33744793723
-
An inverted a-Si:H/c-Si heterojunction for solar energy conversion
-
Wünsch, F., Citarella, G., Abdallah, O., Kunst, M.: An inverted a-Si:H/c-Si heterojunction for solar energy conversion. J. Non-Crystalline Solids 352, 1962–1966 (2006)
-
(2006)
J. Non-Crystalline Solids
, vol.352
, pp. 1962-1966
-
-
Wünsch, F.1
Citarella, G.2
Abdallah, O.3
Kunst, M.4
-
36
-
-
79952684824
-
Effect of wet-chemical substrate pre-treatment on electronic interface properties and recombination losses of a-Si:H/c-Si and a-SiNx:H/c-Si hetero-interfaces
-
Angermann, H., Wünsch, F., Kunst, M., Laades, A., Stürzebecher, U., Conrad, E., Korte, L., Schmidt, M.: Effect of wet-chemical substrate pre-treatment on electronic interface properties and recombination losses of a-Si:H/c-Si and a-SiNx:H/c-Si hetero-interfaces. Accepted by Phys. Stat. Sol. (2011)
-
(2011)
Accepted by Phys. Stat. Sol.
-
-
Angermann, H.1
Wünsch, F.2
Kunst, M.3
Laades, A.4
Stürzebecher, U.5
Conrad, E.6
Korte, L.7
Schmidt, M.8
-
37
-
-
85126694094
-
-
Laades, A.: Preparation and Characterization of Amorphous/Crystalline Silicon Hetero-junctions, Fachbereich Physik. Technische Universität Berlin, Berlin (2005)
-
Laades, A.: Preparation and Characterization of Amorphous/Crystalline Silicon Hetero-junctions, Fachbereich Physik. Technische Universität Berlin, Berlin (2005)
-
-
-
-
38
-
-
0033889503
-
Wet-chemical passivation of Si(111)-and Si(100)-substrates
-
Angermann, H., Henrion, W., Röseler, A., Rebien, M.: Wet-chemical passivation of Si(111)-and Si(100)-substrates. Materials Science and Engineering B 73, 178–183 (2000)
-
(2000)
Materials Science and Engineering B
, vol.73
, pp. 178-183
-
-
Angermann, H.1
Henrion, W.2
Röseler, A.3
Rebien, M.4
-
39
-
-
2942514136
-
Electronic Properties of Wet-Chemically Prepared Oxide Layers
-
Angermann, H., Henrion, W., Rebien, M.: Electronic Properties of Wet-Chemically Prepared Oxide Layers. Solid State Phenomena 76-77,181–184 (2001)
-
(2001)
Solid State Phenomena
, vol.76-77
, pp. 181-184
-
-
Angermann, H.1
Henrion, W.2
Rebien, M.3
-
40
-
-
0008156296
-
Surface States in Silicon from Charges in the Oxide Coating
-
Goetzberger, A., Heine, V., Nicollian, E.H.: Surface States in Silicon from Charges in the Oxide Coating. Appl. Phys. Lett. 12, 95–97 (1968)
-
(1968)
Appl. Phys. Lett.
, vol.12
, pp. 95-97
-
-
Goetzberger, A.1
Heine, V.2
Nicollian, E.H.3
-
41
-
-
0021519639
-
Electronic Traps and Pb Centers at the Si/SiO2 Interface: Band-gap Energy Distributuion
-
Poindexter, E.H., Geraldi, G.J., Rueckel, M.E., Caplan, P.J., Johnson, N.M., Biegelsen, D.K.: Electronic Traps and Pb Centers at the Si/SiO2 Interface: Band-gap Energy Distributuion. J. Appl. Phys. 56, 2844 (1984)
-
(1984)
J. Appl. Phys.
, vol.56
, pp. 2844
-
-
Poindexter, E.H.1
Geraldi, G.J.2
Rueckel, M.E.3
Caplan, P.J.4
Johnson, N.M.5
Biegelsen, D.K.6
-
42
-
-
0029228384
-
Passivity and Electronic Properties of the Silicon/Silicondioxide Interface
-
Flietner, H.: Passivity and Electronic Properties of the Silicon/Silicondioxide Interface. Mat. Sci. Forum 185-188, 73–82 (1995)
-
(1995)
Mat. Sci. Forum
, vol.185-188
, pp. 73-82
-
-
Flietner, H.1
-
43
-
-
0021427238
-
Hole traps and trivalent silicon centers in met-al/oxide/silicon devices
-
Lenahan, P.M., Dressendorfer, P.V.: Hole traps and trivalent silicon centers in met-al/oxide/silicon devices. J. Appl. Phys. 55, 3495–3499 (1984)
-
(1984)
J. Appl. Phys.
, vol.55
, pp. 3495-3499
-
-
Lenahan, P.M.1
Dressendorfer, P.V.2
-
44
-
-
0019529879
-
Identification and properties of Pb-like centers in photoluminescent porous silicon
-
Poindexter, E.H., Caplan, P.J., Deal, B.E., Radzouk, R.R.: Identification and properties of Pb-like centers in photoluminescent porous silicon. J. Appl. Phys. 52, 879 (1981)
-
(1981)
J. Appl. Phys.
, vol.52
, pp. 879
-
-
Poindexter, E.H.1
Caplan, P.J.2
Deal, B.E.3
Radzouk, R.R.4
-
45
-
-
0029326614
-
Defect generation at silicon surfaces during etching and initial stage of oxidation
-
Angermann, H., Kliefoth, K., Füssel, W., Flietner, H.: Defect generation at silicon surfaces during etching and initial stage of oxidation. Microelectron. Eng. 28, 51–54 (1995)
-
(1995)
Microelectron. Eng.
, vol.28
, pp. 51-54
-
-
Angermann, H.1
Kliefoth, K.2
Füssel, W.3
Flietner, H.4
-
46
-
-
4243178138
-
Wet-chemical Preparation and Spectroscopic Characterization of Silicon Interfaces
-
Angermann, H., Henrion, W., Rebien, M., Röseler, A.: Wet-chemical Preparation and Spectroscopic Characterization of Silicon Interfaces. Appl. Surf. Sci. 235, 322– 329 (2004)
-
(2004)
Appl. Surf. Sci.
, vol.235
, pp. 322-329
-
-
Angermann, H.1
Henrion, W.2
Rebien, M.3
Röseler, A.4
-
47
-
-
0027836516
-
Si(100) surface corrosion by NH4F studied using high electron imaging in a spatial resolution secondary UHV-STEM
-
., vol., p
-
Drucker, J., Bandari, A., Burrows, V.A.: Si(100) surface corrosion by NH4F studied using high electron imaging in a spatial resolution secondary UHV-STEM. In: Mater. Res. Soc. Symp. Proc., vol. 315, p. 479 (1993)
-
(1993)
Mater. Res. Soc. Symp. Proc
, vol.315
, pp. 479
-
-
Drucker, J.1
Bandari, A.2
Burrows, V.A.3
-
48
-
-
0027681862
-
Wet chemical etching of Si(100) surfaces in concentrated NH4F solution: Formation of (2x1)H reconstructed Si(100) terraces versus (111) facetting
-
Neuwald, U., Hessel, H.E., Feltz, A., Memmert, U., Behm, R.J.: Wet chemical etching of Si(100) surfaces in concentrated NH4F solution: formation of (2x1)H reconstructed Si(100) terraces versus (111) facetting. Surf. Sci. Lett. 296, L8–L14 (1993)
-
(1993)
Surf. Sci. Lett.
, vol.296
, pp. L8-L14
-
-
Neuwald, U.1
Hessel, H.E.2
Feltz, A.3
Memmert, U.4
Behm, R.J.5
-
49
-
-
65149088270
-
Wet-chemical treatment and electronic interface properties of silicon solar cell substrates
-
Angermann, H., Rappich, J., Klimm, C.: Wet-chemical treatment and electronic interface properties of silicon solar cell substrates. Central Europ. J. Phys. 7, 363–370 (2009)
-
(2009)
Central Europ. J. Phys.
, vol.7
, Issue.363-370
-
-
Angermann, H.1
Rappich, J.2
Klimm, C.3
-
50
-
-
67349219119
-
Passivation of textured substrates for a-Si:H/c-Si hetero-junction solar cells: Effect of wet-chemical smoothing and intrinsic a-Si:H interlayer
-
Angermann, H., Conrad, E., Korte, L., Rappich, J., Schulze, T.F., Schmidt, M.: Passivation of textured substrates for a-Si:H/c-Si hetero-junction solar cells: Effect of wet-chemical smoothing and intrinsic a-Si:H interlayer. Mat. Sci. Eng. B 159-160, 219–223 (2009)
-
(2009)
Mat. Sci. Eng. B
, vol.159-160
, pp. 219-223
-
-
Angermann, H.1
Conrad, E.2
Korte, L.3
Rappich, J.4
Schulze, T.F.5
Schmidt, M.6
-
51
-
-
85126722904
-
Wet-chemical preparation of textured silicon solar cell substrates: Surface conditioning and electronic interface properties
-
Angermann, H., Laades, A., Stürzebecher, U., Conrad, E., Klimm, C., Schulze, T.F., Lawerenz, A., Korte, L.: Wet-chemical preparation of textured silicon solar cell substrates: Surface conditioning and electronic interface properties. In: To be Publish in Solid State Phenomena. Scitech Publ., Zuerich-Uettikon (2010)
-
(2010)
To Be Publish in Solid State Phenomena. Scitech Publ., Zuerich-Uettikon
-
-
Angermann, H.1
Laades, A.2
Stürzebecher, U.3
Conrad, E.4
Klimm, C.5
Schulze, T.F.6
Lawerenz, A.7
Korte, L.8
-
52
-
-
33847416279
-
Study on the mechanism of silicon etching in HNO3-rich HF/HNO3 mixtures
-
Steinert, M., Acker, J., Oswald, S., Wetzing, K.: Study on the mechanism of silicon etching in HNO3-rich HF/HNO3 mixtures. J. Phys. Chem. C 111, 2122–2140 (2007)
-
(2007)
J. Phys. Chem. C
, vol.111
, Issue.2122-2140
-
-
Steinert, M.1
Acker, J.2
Oswald, S.3
Wetzing, K.4
-
53
-
-
0033077867
-
Investigation of Acidic Texturization for Multicrystalline Silicon Solar Cells
-
Nishimoto, Y., Ishahara, T., Namba, K.: Investigation of Acidic Texturization for Multicrystalline Silicon Solar Cells. J. Electrochem. Soc. 146, 457–461 (1999)
-
(1999)
J. Electrochem. Soc.
, vol.146
, pp. 457-461
-
-
Nishimoto, Y.1
Ishahara, T.2
Namba, K.3
-
54
-
-
0033896079
-
Acid based etching of silicon wafers: Mass-transfer and kinetic effects
-
Kulkarni, M.S., Erk, H.F.: Acid based etching of silicon wafers: mass-transfer and kinetic effects. J. Electrochem. Soc. 147, 176–188 (2000)
-
(2000)
J. Electrochem. Soc.
, vol.147
, pp. 176-188
-
-
Kulkarni, M.S.1
Erk, H.F.2
-
55
-
-
0037473602
-
Texturization of monocrystalline silicon with tribasic sodium phosphate
-
Xi, Z., Yang, D., Que, D.: Texturization of monocrystalline silicon with tribasic sodium phosphate. Sol. Energ. Mat. Sol. Cells 77, 255–263 (2003)
-
(2003)
Sol. Energ. Mat. Sol. Cells
, vol.77
, pp. 255-263
-
-
Xi, Z.1
Yang, D.2
Que, D.3
-
56
-
-
75949123496
-
Surface texturization and interface passivation of mono-crystalline silicon substrates by wet chemical treatments
-
Sievert, W., Zimmermann, K.-U., Hartmann, B., Klimm, C., Jacob, K., Angermann, H.: Surface texturization and interface passivation of mono-crystalline silicon substrates by wet chemical treatments. Solid State Phenomena 145-146, 223–226 (2009)
-
(2009)
Solid State Phenomena
, vol.145-146
, pp. 223-226
-
-
Sievert, W.1
Zimmermann, K.-U.2
Hartmann, B.3
Klimm, C.4
Jacob, K.5
Angermann, H.6
-
57
-
-
40949103623
-
Wet-chemical passivation of atomically flat and structured silicon substrates for solar cell application
-
Angermann H., Rappich J., Korte L., Sieber I., Conrad E., Schmidt M., Hübener K., Polte J., Hauschild J.: Wet-chemical passivation of atomically flat and structured silicon substrates for solar cell application. Appl. Surf. Sci. 254, 3615–3625 (2008).
-
(2008)
Appl. Surf. Sci.
, vol.254
, pp. 3615-3625
-
-
Angermann, H.1
Rappich, J.2
Korte, L.3
Sieber, I.4
Conrad, E.5
Schmidt, M.6
Hübener, K.7
Polte, J.8
Hauschild, J.9
-
58
-
-
41149088958
-
Smoothing and passivation of special Si(111) substrates: Studied by SPV, PL, AFM and SEM measurements
-
Angermann, H., Rappich, J., Sieber, I., Hübener, K., Hauschild, J.: Smoothing and passivation of special Si(111) substrates: studied by SPV, PL, AFM and SEM measurements. J. Anal. Bioanal. Chem. 390, 1463–1470 (2008)
-
(2008)
J. Anal. Bioanal. Chem.
, vol.390
, pp. 1463-1470
-
-
Angermann, H.1
Rappich, J.2
Sieber, I.3
Hübener, K.4
Hauschild, J.5
-
59
-
-
45849102121
-
Optimisation of electronic interface properties of a-Si:H/c-Si hetero-junction solar cells by wet-chemical surface pre-treatment
-
Angermann, H., Korte, L., Rappich, J., Conrad, E., Sieber, I., Schmidt, M., Hübener, K., Hauschild, J.: Optimisation of electronic interface properties of a-Si:H/c-Si hetero-junction solar cells by wet-chemical surface pre-treatment. Thin Solid Films 516, 6775–6781 (2008)
-
(2008)
Thin Solid Films
, vol.516
, pp. 6775-6781
-
-
Angermann, H.1
Korte, L.2
Rappich, J.3
Conrad, E.4
Sieber, I.5
Schmidt, M.6
Hübener, K.7
Hauschild, J.8
-
60
-
-
0026867118
-
In situ preparation of hydrogen-terminated silicon single-crystal surfaces
-
Bitzer, T., Lewerenz, H.J.: In situ preparation of hydrogen-terminated silicon single-crystal surfaces. Surf. Sci. 269/270, 886 (1992)
-
(1992)
Surf. Sci.
, vol.269-270
, pp. 886
-
-
Bitzer, T.1
Lewerenz, H.J.2
-
61
-
-
0032671082
-
Characterization of silicon surface preparation processes for advanced gate dielectrics
-
Okorn-Schmidt, H.F.: Characterization of silicon surface preparation processes for advanced gate dielectrics. IBM J. Res. Develop. 43, 351–366 (1999)
-
(1999)
IBM J. Res. Develop.
, vol.43
, pp. 351-366
-
-
Okorn-Schmidt, H.F.1
-
63
-
-
17744387131
-
Chemical treatment effects of silicon surfaces in aqueous KF solution
-
Noguchi, H., Adachi, S.: Chemical treatment effects of silicon surfaces in aqueous KF solution. Appl. Surf. Sci. 246, 139–148 (2005)
-
(2005)
Appl. Surf. Sci.
, vol.246
, pp. 139-148
-
-
Noguchi, H.1
Adachi, S.2
-
64
-
-
36449006528
-
Fundamentals of Two-step Etching Techniques for Ideal Silicon-hydrogen Termination of Silicon (111)
-
Yang, S.K., Peter, S., Takoudis, C.G.: Fundamentals of Two-step Etching Techniques for Ideal Silicon-hydrogen Termination of Silicon (111). J. Appl. Phys. 76, 4107–4112 (1994)
-
(1994)
J. Appl. Phys.
, vol.76
, pp. 4107-4112
-
-
Yang, S.K.1
Peter, S.2
Takoudis, C.G.3
-
65
-
-
33845566733
-
Control factor of native oxide growth on silicon in air or in ultrapure water
-
Morita, M., Ohmi, T., Hasegawa, E., Kavakami, M., Suma, K.: Control factor of native oxide growth on silicon in air or in ultrapure water. Appl. Phys. Lett. 55, 562– 564 (1989)
-
(1989)
Appl. Phys. Lett.
, vol.55
, pp. 562-564
-
-
Morita, M.1
Ohmi, T.2
Hasegawa, E.3
Kavakami, M.4
Suma, K.5
-
67
-
-
77649179923
-
Stability of hydrogen-terminated vicinal Si(1 1 1) surface under ambient atmosphere. Appl. Surf
-
silicon(111) and (100) surfaces. J. Vac. Sci. Technol. A 7, 808–813 (1989) [67] Kolìbal, M., Čechal, J., Bartošìk, M., Mach, J., Šikola, T.: Stability of hydrogen-terminated vicinal Si(1 1 1) surface under ambient atmosphere. Appl. Surf. Sci. 256, 3423–3426 (2010)
-
(2010)
Sci
, vol.256
, pp. 3423-3426
-
-
-
68
-
-
77957128961
-
Characterization on the Passivation Stability of HF Aqueous Solution Treated Silicon Surfaces for HIT Solar Cell Application by the Effective Minority Carrier Lifetime Measurement
-
Zhao, L., Zhou, C., Li, H., Diao, H., Wang, W.: Characterization on the Passivation Stability of HF Aqueous Solution Treated Silicon Surfaces for HIT Solar Cell Application by the Effective Minority Carrier Lifetime Measurement. Chin. J. Phys. 48, 392–399 (2010)
-
(2010)
Chin. J. Phys.
, vol.48
, pp. 392-399
-
-
Zhao, L.1
Zhou, C.2
Li, H.3
Diao, H.4
Wang, W.5
-
69
-
-
2942585394
-
Wet-chemical passivation and characterization of silicon interfaces for solar cell applications
-
Angermann, H., Henrion, W., Rebien, M., Röseler, A.: Wet-chemical passivation and characterization of silicon interfaces for solar cell applications. Sol. Energy Mat. Sol. Cells 83, 331–346 (2004)
-
(2004)
Sol. Energy Mat. Sol. Cells
, vol.83
, pp. 331-346
-
-
Angermann, H.1
Henrion, W.2
Rebien, M.3
Röseler, A.4
-
70
-
-
19944387647
-
Stable electrochemically passivated Si surfaces by ultra thin benzene-type layers
-
Rappich, J.H.P., Nickel, N.H., Sieber, I., Schulze, S., Dittrich, T.: Stable electrochemically passivated Si surfaces by ultra thin benzene-type layers. Microelectronic Engineering 80, 62–65 (2005)
-
(2005)
Microelectronic Engineering
, vol.80
, pp. 62-65
-
-
Rappich, J.H.P.1
Nickel, N.H.2
Sieber, I.3
Schulze, S.4
Dittrich, T.5
-
71
-
-
77955324364
-
In situ monitoring of the electronic properties and the pH stability of grafted Si(111)
-
Aureau, D., Rappich, J., Moraillon, A., Allongue, P., Ozanam, F., Chazalviel, J.-N.: In situ monitoring of the electronic properties and the pH stability of grafted Si(111). J. Electroanal. Chem. 646, 33–42 (2010)
-
(2010)
J. Electroanal. Chem.
, vol.646
, pp. 33-42
-
-
Aureau, D.1
Rappich, J.2
Moraillon, A.3
Allongue, P.4
Ozanam, F.5
Chazalviel, J.-N.6
-
72
-
-
0029254434
-
H2O2 Decomposition and Its Impact on Silicon Surface Roughening and Gate Oxide Integrity
-
Schmidt, H.F., Meuris, M., Mertens, P.W., Rotondaro, A.L.P., Heyns, M.M., Hurd, T.Q., Hachter, Z.: H2O2 Decomposition and Its Impact on Silicon Surface Roughening and Gate Oxide Integrity. Jpn. J. Appl. Phys. 34, 727–731 (1995)
-
(1995)
Jpn. J. Appl. Phys.
, vol.34
, pp. 727-731
-
-
Schmidt, H.F.1
Meuris, M.2
Mertens, P.W.3
Rotondaro, A.L.P.4
Heyns, M.M.5
Hurd, T.Q.6
Hachter, Z.7
-
73
-
-
0026837569
-
Dependence of thin-oxide films quality on surface microroughness
-
Ohmi, T., Miyashita, M., Itano, M., Imaoka, T., Kawanabe, I.: Dependence of thin-oxide films quality on surface microroughness. IEEE Trans. Electron Devices 39, 537–545 (1992)
-
(1992)
IEEE Trans. Electron Devices
, vol.39
, pp. 537-545
-
-
Ohmi, T.1
Miyashita, M.2
Itano, M.3
Imaoka, T.4
Kawanabe, I.5
-
74
-
-
0029250675
-
Effect of SC1 Process on Silicon Surface Microroughness and Oxide Breakdown Characteristics
-
Akiyama, K., Naito, N., Nagamori, M., Koya, H., Morita, E., Sassa, K., Suga, H.: Effect of SC1 Process on Silicon Surface Microroughness and Oxide Breakdown Characteristics. Jpn. J. Appl. Phys. 34, L153–L155 (1995)
-
(1995)
Jpn. J. Appl. Phys.
, vol.34
, pp. L153-L155
-
-
Akiyama, K.1
Naito, N.2
Nagamori, M.3
Koya, H.4
Morita, E.5
Sassa, K.6
Suga, H.7
-
75
-
-
0343832016
-
The preparation of flat H-Si(111) surfaces in 40% NH4F revisited
-
Allongue, P., de Villeneuvea, C.H., Morin, S., Boukherroub, R., Wayner, D.D.M.: The preparation of flat H-Si(111) surfaces in 40% NH4F revisited. Electrochimica Acta 45, 4591–4598 (2000)
-
(2000)
Electrochimica Acta
, vol.45
, pp. 4591-4598
-
-
Allongue, P.1
de Villeneuvea, C.H.2
Morin, S.3
Boukherroub, R.4
Wayner, D.D.M.5
-
76
-
-
34547637095
-
Physical aspects of a-Si:H/c-Si hetero-junction solar cells
-
Schmidt, M., Korte, L., Laades, A., Stangl, R., Schubert, C., Angermann, H., Conrad, E., van Maydell, K.: Physical aspects of a-Si:H/c-Si hetero-junction solar cells. Thin Solid Films 515, 7475–7480 (2007)
-
(2007)
Thin Solid Films
, vol.515
, pp. 7475-7480
-
-
Schmidt, M.1
Korte, L.2
Laades, A.3
Stangl, R.4
Schubert, C.5
Angermann, H.6
Conrad, E.7
van Maydell, K.8
-
77
-
-
79953652386
-
Wet-Chemical Pre-Treatment of c-Si Substrates Enhancing the Performance of a-Si:H/c-Si Hetero-Junction Solar Cells
-
Becker, J.-P., Pysch, D., Leimenstoll, A., Hermle, M., Glunz, S.W.: Wet-Chemical Pre-Treatment of c-Si Substrates Enhancing the Performance of a-Si:H/c-Si Hetero-Junction Solar Cells. In: 24th European PV Solar Energy Conference and Exhibition, Hamburg, Germany (2009)
-
(2009)
24Th European PV Solar Energy Conference and Exhibition, Hamburg, Germany
-
-
Becker, J.-P.1
Pysch, D.2
Leimenstoll, A.3
Hermle, M.4
Glunz, S.W.5
-
78
-
-
85044441527
-
Cleaning and passivation of structured n-type Si substrates: Preparation and interface properties of a-Si:H/c-Si hetero solar cells
-
Lincot, D. (ed.), pp. , WIP Renewable Energies, München
-
Angermann, H., Schulze, T.F., Conrad, E., Rappich, J., Korte, L., Schmidt, M.: Cleaning and passivation of structured n-type Si substrates: preparation and interface properties of a-Si:H/c-Si hetero solar cells. In: Lincot, D. (ed.) 23rd European Photovoltaic Solar Energy Conference, Valencia, Spain, pp. 1422–1426. WIP Renewable Energies, München (2008)
-
(2008)
23Rd European Photovoltaic Solar Energy Conference, Valencia, Spain
, pp. 1422-1426
-
-
Angermann, H.1
Schulze, T.F.2
Conrad, E.3
Rappich, J.4
Korte, L.5
Schmidt, M.6
-
79
-
-
85126665252
-
Overview on a-Si:H/c-Si heterojunction solar cells-physics and technology
-
Korte, L., Conrad, E., Angermann, H., Stangl, R., Schmidt, M.: Overview on a-Si:H/c-Si heterojunction solar cells-physics and technology. In: 22nd European Photovoltaic Solar Energy Conference, Milan, Italy, pp. 859–865 (2007)
-
(2007)
22Nd European Photovoltaic Solar Energy Conference, Milan, Italy, Pp. 859–865
-
-
Korte, L.1
Conrad, E.2
Angermann, H.3
Stangl, R.4
Schmidt, M.5
-
80
-
-
41849135274
-
Our Approaches for Achieving HIT Solar Cells With More Than 23% Efficiency
-
Taira, S., Yoshimine, Y., Baba, T., Taguchi, M., Kanno, H., Kinoshita, T., Sakata, H., Maruyama, E., Tanaka, M.: Our Approaches for Achieving HIT Solar Cells With More Than 23% Efficiency. In: 22nd European Photovoltaic Solar Energy Conference, Milan, Italy, pp. 932–935 (2007)
-
(2007)
22Nd European Photovoltaic Solar Energy Conference, Milan, Italy, Pp. 932–935
-
-
Taira, S.1
Yoshimine, Y.2
Baba, T.3
Taguchi, M.4
Kanno, H.5
Kinoshita, T.6
Sakata, H.7
Maruyama, E.8
Tanaka, M.9
-
81
-
-
85126676378
-
-
Rome, Italy, p
-
Scherff, M.L.D., Froitzheim, A., Ulyashin, A., Schmidt, M., Fahrner, W.R., Fuhs, W.: 16.2% Efficiency for amorphous/crystalline heterojunction solar cells on flat p-type silicon wafers. In: PV in Europe-From PV Technology to Energy Solutions, Rome, Italy, p. 7 (2002)
-
(2002)
16.2% Efficiency for Amorphous/Crystalline Heterojunction Solar Cells on Flat P-Type Silicon Wafers
, pp. 7
-
-
Scherff, M.L.D.1
Froitzheim, A.2
Ulyashin, A.3
Schmidt, M.4
Fahrner, W.R.5
Fuhs, W.6
-
82
-
-
85126671172
-
Surface Texturization and Interface Passivation of Mono-and Polycrystalline Silicon Substrates: Evaluation of the Wet-Chemical Treatments by UV-NIR-Reflectance
-
Angermann, H., Uredat, S., Zettler, J.-T.: Surface Texturization and Interface Passivation of Mono-and Polycrystalline Silicon Substrates: Evaluation of the Wet-Chemical Treatments by UV-NIR-Reflectance. In: 24th European Photovoltaic Solar Energy Conference, Hamburg, Germany, pp. 1954–1957 (2009)
-
(2009)
24Th European Photovoltaic Solar Energy Conference, Hamburg, Germany, Pp. 1954–1957
-
-
Angermann, H.1
Uredat, S.2
Zettler, J.-T.3
-
83
-
-
66549096443
-
Twenty-two percent efficiency HIT solar cell
-
Tsunomura, Y., Yoshimine, Y., Taguchi, M., Baba, T., Kinoshita, T., Kanno, H., Sakata, H., Maruyama, E., Tanaka, M.: Twenty-two percent efficiency HIT solar cell. Sol. Energy Mater. Sol. Cells 93, 670–673 (2009)
-
(2009)
Sol. Energy Mater. Sol. Cells
, vol.93
, pp. 670-673
-
-
Tsunomura, Y.1
Yoshimine, Y.2
Taguchi, M.3
Baba, T.4
Kinoshita, T.5
Kanno, H.6
Sakata, H.7
Maruyama, E.8
Tanaka, M.9
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