Contactless determination of current-voltage characteristics and minority-carrier lifetimes in semiconductors from quasi-steady-state photoconductance data

Applied Physics Letters

Volumn 69, Issue 17, 1996, Pages 2510-2512

  Sinton, Ronald A ^a   Cuevas, Andres ^b  

^a Sinton Consulting   (United States)

^b AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000513411     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117723     Document Type: Article

References (5)

1. D. K. Schroder, Semiconductor Material and Device Characterization (Wiley, New York, 1990).
2. R. K. Ahrenkiel, B. M. Keyes, and D. L. Levi, Recombination Processes in Polycrystalline Photovoltaic Materials, Proceedings of the 13th European Photovoltaic Solar Energy Conf., Nice, 1996 (H. S. Stephens, Bedford, 1995), p. 914.
3. G. Massetti, M. Severi, and S. Solmi, IEEE Trans. Electron Devices ED-30, 764 (1983).
4. F. Dannhauser, Solid-State Electron. 15, 1371 (1972).
5. D. E. Kane and R. M. Swanson, Measurement of the Emitter Saturation Current by a Contactless Photoconductivity Decay Method, Proceedings of the 18th IEEE Photovoltaics Specialist Conference, Las Vegas, 1985 (IEEE, New York, 1985), p. 578.