Characterization on the passivation stability of HF aqueous solution treated silicon surfaces for HIT solar cell application by the effective minority carrier lifetime measurement

Chinese Journal of Physics

Volumn 48, Issue 3, 2010, Pages 392-399

  Zhao, Lei ^a   Zhou, Chunlan ^a   Li, Hailing ^a   Diao, Hongwei ^a   Wang, Wenjing ^a  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77957128961     PISSN: 05779073     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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