Detailed analysis of the microwave-detected photoconductance decay in crystalline silicon

Journal of Applied Physics

Volumn 104, Issue 10, 2008, Pages

  Lauer, K ^a,b   Laades, A ^a   Ubensee H ^a   Metzner, H ^a,c   Lawerenz, A ^a  

^a SolarTestLab Laboratory   (Germany)

^b ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

^c FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CIVIL AVIATION; CRYSTALLINE MATERIALS; MICROWAVES; SEMICONDUCTING SILICON COMPOUNDS; SILICON; SILICON WAFERS; SOLAR ENERGY;

BULK LIFETIMES; CRYSTALLINE SILICONS; DARK CONDUCTIVITIES; EVALUATION APPROACHES; EVALUATION METHODS; EXCESS CARRIERS; INTERSTITIAL IRONS; LOW CRYSTALLINE; LOW PURITIES; MINORITY CARRIER LIFETIMES; MINORITY CARRIERS; NUMERICAL SIMULATIONS; PHOTOCONDUCTANCE; SPATIAL RESOLUTION.; SPATIAL RESOLUTIONS;

CARRIER LIFETIME;

EID: 57049153986     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3021459     Document Type: Article

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