Understanding soft errors in uncore components

Proceedings - Design Automation Conference

Volumn 2015-July, Issue , 2015, Pages

  Cho, Hyungmin ^a   Cher, Chen Yong ^b   Shepherd, Thomas ^a   Mitra, Subhasish ^a  

^a STANFORD UNIVERSITY   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Recovery; Simulation; Soft Error; Uncore Components

Indexed keywords

COMPUTER AIDED DESIGN; CONTROLLERS; DYNAMIC RANDOM ACCESS STORAGE; ERROR CORRECTION; MEMORY ARCHITECTURE; OPEN SYSTEMS; PROGRAMMABLE LOGIC CONTROLLERS; RADIATION HARDENING; RECOVERY; APPLICATION SPECIFIC INTEGRATED CIRCUITS; ERRORS; SYSTEM-ON-CHIP;

LEVELS OF ABSTRACTION; MEMORY SUBSYSTEMS; MIXED MODE SIMULATION; RECOVERY TECHNIQUES; SIMULATION; SOFT ERROR; TRADITIONAL SYSTEMS; UNCORE COMPONENTS; RESILIENCE;

SYSTEM-ON-CHIP; MICROPROCESSOR CHIPS;

EID: 84944096289     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/2744769.2744923     Document Type: Conference Paper

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