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Volumn , Issue , 2008, Pages 122-127

Statistical fault injection

Author keywords

Fault injection; SER; SFI; Soft errors

Indexed keywords

FAULT INJECTION; SER; SFI; SOFT ERRORS;

EID: 53349175698     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DSN.2008.4630080     Document Type: Conference Paper
Times cited : (65)

References (18)
  • 7
    • 77949423883 scopus 로고    scopus 로고
    • T. Tsai and R. Iyer, FTAPE: A Fault Injection Tool to Measure Fault Tolerance, presented at Computing in Aerospace, 1995.
    • T. Tsai and R. Iyer, "FTAPE: A Fault Injection Tool to Measure Fault Tolerance," presented at Computing in Aerospace, 1995.
  • 9
    • 0036294466 scopus 로고    scopus 로고
    • Functional Verification of the POWER4 microprocessor and POWER4 multiprocessor systems
    • Jan
    • J. M Ludden, et. al. "Functional Verification of the POWER4 microprocessor and POWER4 multiprocessor systems," in IBM Journal on Research and Development, Vol 46, No. 1 Jan, 2002.
    • (2002) IBM Journal on Research and Development , vol.46 , Issue.1
    • Ludden, J.M.1    et., al.2
  • 10
    • 21044441785 scopus 로고    scopus 로고
    • Verification Strategy for the Blue Oene/L chip
    • M. Wazlowski et al "Verification Strategy for the Blue Oene/L chip," IBM Journal on Research and Development", Vol 49, No. 2/3, 2005
    • (2005) IBM Journal on Research and Development , vol.49 , Issue.2-3
    • Wazlowski, M.1
  • 17
    • 0033220884 scopus 로고    scopus 로고
    • Stress-Based and Path-Based Fault Injection
    • T. Tsai et al., "Stress-Based and Path-Based Fault Injection," IEEE Transactions on Computers, Vol 48, No 11, 1999.
    • (1999) IEEE Transactions on Computers , vol.48 , Issue.11
    • Tsai, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.