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Volumn , Issue , 2005, Pages 243-247

The soft error problem: An architectural perspective

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[No Author keywords available]

Indexed keywords


EID: 28444483117     PISSN: 15300897     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HPCA.2005.37     Document Type: Conference Paper
Times cited : (340)

References (20)
  • 2
    • 84881280533 scopus 로고    scopus 로고
    • Soft error rate overview and technology trends
    • Reliability Fundamentals, Sunday, April 7
    • Robert Baumann, "Soft Error Rate Overview and Technology Trends," 2002 Reliability Physics Tutorial Notes, Reliability Fundamentals, Sunday, April 7, 2002.
    • (2002) 2002 Reliability Physics Tutorial Notes
    • Baumann, R.1
  • 11
  • 15
    • 0032667728 scopus 로고    scopus 로고
    • IBM's S/390 05 microprocessor design
    • Mach/April
    • T.J. Siegel, et al., "IBM's S/390 05 Microprocessor Design," IEEE Micro, pp 12-23, Mach/April 1999.
    • (1999) IEEE Micro , pp. 12-23
    • Siegel, T.J.1
  • 17
    • 0029701840 scopus 로고    scopus 로고
    • Impact of cosmic ray neutron induced soft errors, on advanced submicron CMOS circuits
    • Tosaka, et al., "Impact of Cosmic Ray Neutron Induced Soft Errors, on Advanced Submicron CMOS circuits," Symposium on VLSI Technology Digest of Technical papers, 1996.
    • (1996) Symposium on VLSI Technology Digest of Technical Papers
    • Tosaka1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.