Cross-layer resilience challenges: Metrics and optimization

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2010, Pages 1029-1034

  Mitra, Subhasish ^a   Brelsford, Kevin ^a   Sanda, Pia N ^b  

^a STANFORD UNIVERSITY   (United States)

^b IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GLOBAL OPTIMIZATION;

HARDWARE RELIABILITY; HELP SYSTEMS; MULTIPLE LAYERS; QUANTIFICATION AND VALIDATIONS; ROBUST SYSTEM DESIGN; ROBUST SYSTEMS; SYSTEM STACKS; USER EXPECTATIONS;

SYSTEMS ANALYSIS;

EID: 77953111628     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/date.2010.5456961     Document Type: Conference Paper

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