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Volumn 25, Issue 5, 1999, Pages 619-632

Hierarchical simulation approach to accurate fault modeling for system dependability evaluation

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COMPUTER SYSTEM RECOVERY; DATA STORAGE EQUIPMENT; MATHEMATICAL MODELS; MICROPROCESSOR CHIPS; RESPONSE TIME (COMPUTER SYSTEMS);

EID: 0033316552     PISSN: 00985589     EISSN: None     Source Type: Journal    
DOI: 10.1109/32.815322     Document Type: Article
Times cited : (31)

References (17)
  • 2
    • 27544463457 scopus 로고
    • FOCUS: An Experimental Environment for Fault Sensitivity Analysis
    • Dec.
    • G. Choi and R.K. Iyer, "FOCUS: An Experimental Environment for Fault Sensitivity Analysis," IEEE Trans. Computers, vol. 41, no. 12, pp. 1,515-1,526, Dec. 1992.
    • (1992) IEEE Trans. Computers , vol.41 , Issue.12 , pp. 515-526
    • Choi, G.1    Iyer, R.K.2
  • 3
    • 0027188657 scopus 로고
    • REACT: A Synthesis and Evaluation Tool for Fault-Tolerant Multiprocessor Architectures
    • J.A. Clark and D.K. Pradhan, "REACT: A Synthesis and Evaluation Tool for Fault-Tolerant Multiprocessor Architectures," Proc. Ann. Reliability and Maintainability Symp.," pp. 428-435, 1993.
    • (1993) Proc. Ann. Reliability and Maintainability Symp. , pp. 428-435
    • Clark, J.A.1    Pradhan, D.K.2
  • 4
    • 0029212722 scopus 로고
    • System-Level Modeling in the ADEPT Environment of a Distributed Computer System for Real-time Applications
    • A.K. Ghosh and B.W. Johnson, "System-Level Modeling in the ADEPT Environment of a Distributed Computer System for Real-time Applications," Proc. IEEE Int'l Computer Performance and Dependability Symp., pp. 194-203, 1995.
    • (1995) Proc. IEEE Int'l Computer Performance and Dependability Symp. , pp. 194-203
    • Ghosh, A.K.1    Johnson, B.W.2
  • 5
    • 0031388396 scopus 로고    scopus 로고
    • DEPEND: A Simulation-Based Environment for System-Level Dependability Analysis
    • Jan.
    • K.K. Goswami, R.K. Iyer, and L. Young, "DEPEND: A Simulation-Based Environment for System-Level Dependability Analysis," IEEE Trans. Computers, vol. 46, no. 1, pp. 60-74, Jan. 1997.
    • (1997) IEEE Trans. Computers , vol.46 , Issue.1 , pp. 60-74
    • Goswami, K.K.1    Iyer, R.K.2    Young, L.3
  • 7
    • 33749981533 scopus 로고    scopus 로고
    • ISE Integrated Systems Engineering DESSIS Reference Manual, Version 1.3. Technopark, Zurich, Switzerland: ISE Integrated Systems Eng. AG.
    • ISE Integrated Systems Engineering DESSIS Reference Manual, Version 1.3. Technopark, Zurich, Switzerland: ISE Integrated Systems Eng. AG.
  • 8
    • 0003144276 scopus 로고    scopus 로고
    • Experimental Analysis of Computer System Dependability
    • ch. 5, D.K. Pradhan, ed., Prentice Hall
    • R.K. Iyer and D. Tang, "Experimental Analysis of Computer System Dependability," Fault-Tolerant Computer System Design, ch. 5, D.K. Pradhan, ed., Prentice Hall, 1996.
    • (1996) Fault-Tolerant Computer System Design
    • Iyer, R.K.1    Tang, D.2
  • 12
    • 33749915165 scopus 로고    scopus 로고
    • Lanai 4.x, http://www.myri.com/scs/documentation/mug/development/LANai4.X.doc.
    • Lanai 4.x
  • 13
    • 0020298427 scopus 로고
    • Collection of Charge on Junction Nodes from Ion Tracks
    • G.C. Messenger, "Collection of Charge on Junction Nodes from Ion Tracks," IEEE Trans. Nuclear Science, vol. 29, no. 6, pp. 2,024-2,031, 1982.
    • (1982) IEEE Trans. Nuclear Science , vol.29 , Issue.6 , pp. 2024-2031
    • Messenger, G.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.