-
1
-
-
79952936606
-
Impact of SiC devices on hybrid electric and plug-in hybrid electric vehicles
-
Mar./Apr.
-
H. Zhang, L. M. Tolbert, and B. Ozpineci, "Impact of SiC devices on hybrid electric and plug-in hybrid electric vehicles," IEEE Trans. Ind. Appl., vol. 47, no. 2, pp. 912-921, Mar./Apr. 2011.
-
(2011)
IEEE Trans. Ind. Appl.
, vol.47
, Issue.2
, pp. 912-921
-
-
Zhang, H.1
Tolbert, L.M.2
Ozpineci, B.3
-
2
-
-
83655192819
-
High-power modular multilevel converters with SiC JFETs
-
Jan.
-
D. Peftitsis, G. Tolstoy, A. Antonopoulos, J. Rabkowski, J.-K. Lim, M. Bakowski, L. Ä ngquist, and H.-P. Nee, "High-power modular multilevel converters with SiC JFETs," IEEE Trans. Power Electron., vol. 27, no. 1, pp. 28-36, Jan. 2012.
-
(2012)
IEEE Trans. Power Electron
, vol.27
, Issue.1
, pp. 28-36
-
-
Peftitsis, D.1
Tolstoy, G.2
Antonopoulos, A.3
Rabkowski, J.4
Lim, J.-K.5
Bakowski, M.6
Ängquist, L.7
Nee, H.-P.8
-
3
-
-
13244279673
-
SiC GTO thyristor model for HVDC interface
-
2004 IEEE Power Engineering Society General Meeting
-
M. Chinthavali, L. M. Tolbert, and B.Ozpineci, "SiC GTOthyristor model for HVDC interface," in Proc. IEEE Power Eng. Gen. Meeting, Jun. 6-10, 2004, Denver, CO, USA, pp. 680-685. (Pubitemid 40192068)
-
(2004)
2004 IEEE Power Engineering Society General Meeting
, vol.1
, pp. 680-685
-
-
Chinthavali, M.1
Tolbert, L.M.2
Ozpineci, B.3
-
4
-
-
79955766666
-
A120 ?Cambient temperature forced air-cooled normally-off SiC JFET automotive inverter system
-
Mar.6-11
-
D.Bortis,B. Wrzecionko, and J. W.Kolar, "A120 ?Cambient temperature forced air-cooled normally-off SiC JFET automotive inverter system," in Proc. 26th Annu. IEEE Appl. Power Electron. Conf. Expo., Mar. 6-11, 2011, pp. 1282-1289.
-
(2011)
Proc. 26th Annu. IEEE Appl. Power Electron. Conf. Expo.
, pp. 1282-1289
-
-
Bortis, D.1
Wrzecionko, B.2
Kolar, J.W.3
-
5
-
-
78650190002
-
Efficiency impact of silicon carbide power electronics for modern wind turbine full scale frequency converter
-
Jan.
-
H. Zhang and L. M. Tolbert, "Efficiency impact of silicon carbide power electronics for modern wind turbine full scale frequency converter," IEEE Trans. Ind. Electron., vol. 58, no. 1, pp. 21-28, Jan. 2011.
-
(2011)
IEEE Trans. Ind. Electron.
, vol.58
, Issue.1
, pp. 21-28
-
-
Zhang, H.1
Tolbert, L.M.2
-
6
-
-
79959286484
-
SiC versus Si-Evaluation of potentials for performance improvement of inverter and DC-DC converter systems by SiC power semiconductors
-
Jul.
-
J. Biela, M. Schweizer, S. Waffler, and J. W. Kolar, "SiC versus Si-Evaluation of potentials for performance improvement of inverter and DC-DC converter systems by SiC power semiconductors," IEEE Trans. Ind. Electron., vol. 58, no. 7, pp. 2872-2882, Jul. 2011.
-
(2011)
IEEE Trans. Ind. Electron.
, vol.58
, Issue.7
, pp. 2872-2882
-
-
Biela, J.1
Schweizer, M.2
Waffler, S.3
Kolar, J.W.4
-
7
-
-
77956547372
-
High power SiC modules for HEVs and PHEVs
-
Jun. 21-24
-
M. Chinthavali, L. M. Tolbert, H. Zhang, J. H. Han, F. Barlow, and B. Ozpineci, "High power SiC modules for HEVs and PHEVs," in Proc. Int. Power Electron. Conf., Jun. 21-24, 2010, pp. 1842-1848.
-
(2010)
Proc. Int. Power Electron. Conf.
, pp. 1842-1848
-
-
Chinthavali, M.1
Tolbert, L.M.2
Zhang, H.3
Han, J.H.4
Barlow, F.5
Ozpineci, B.6
-
8
-
-
33744975291
-
Inherently safe DC/DC converter using a normally-on SiC JFET
-
DOI 10.1109/APEC.2005.1453244, 1453244, Twentieth Annual IEEEApplied Power ElectronicsConference and Exposition, APEC 2005
-
R. L. Kelley, M. S. Mazzola, W. A. Draper, and J. Casady, "Inherently safe DC/DC converter using a normally-on SiC JFET," in Proc. 20th Annu. IEEE Appl. Power Electron. Conf. Expo., Mar. 6-10, 2005, vol. 3, pp. 1561-1565. (Pubitemid 43860994)
-
(2005)
Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
, vol.3
, pp. 1561-1565
-
-
Kelley, R.L.1
Mazzola, M.S.2
Draper, W.A.3
Casady, J.4
-
9
-
-
52349088244
-
Power factor correction using an enhancement-mode SiC JFET
-
Jun. 15-19
-
R. L. Kelley, M. S. Mazzola, S. Morrison, W. Draper, I. Sankin, D. Sheridan, and J. Casady, "Power factor correction using an enhancement-mode SiC JFET," in Proc. EEE Power Electron. Spec. Conf., Jun. 15-19, 2008, pp. 4766-4769.
-
(2008)
Proc. EEE Power Electron. Spec. Conf.
, pp. 4766-4769
-
-
Kelley, R.L.1
Mazzola, M.S.2
Morrison, S.3
Draper, W.4
Sankin, I.5
Sheridan, D.6
Casady, J.7
-
10
-
-
77956548012
-
Advances in SiC VJFETs for renewable and high-efficiency power electronics applications
-
Jun. 21-24
-
D. C. Sheridan, A. Ritenour, R. Kelley, V. Bondarenko, and J. B. Casady, "Advances in SiC VJFETs for renewable and high-efficiency power electronics applications," in Proc. Int. Power Electron. Conf., Jun. 21-24, 2010, pp. 3254-3258.
-
(2010)
Proc. Int. Power Electron. Conf.
, pp. 3254-3258
-
-
Sheridan, D.C.1
Ritenour, A.2
Kelley, R.3
Bondarenko, V.4
Casady, J.B.5
-
11
-
-
84862658720
-
Silicon carbide power transistors-A new ERA in power electronics is initiated
-
Jun.
-
J. Rabkowski, D. Peftitsis, and H.-P. Nee, "Silicon carbide power transistors-A new ERA in power electronics is initiated," IEEE Ind. Electron. Mag., vol. 6, no. 2, pp. 17-26, Jun. 2012.
-
(2012)
IEEE Ind. Electron. Mag.
, vol.6
, Issue.2
, pp. 17-26
-
-
Rabkowski, J.1
Peftitsis, D.2
Nee, H.-P.3
-
12
-
-
84860184738
-
Design steps towards a 40-kVA SiC inverter with an efficiency exceeding 99.5%
-
Feb. 5-9
-
J. Rabkowski, D. Peftitsis, and H.-P. Nee, "Design steps towards a 40-kVA SiC inverter with an efficiency exceeding 99.5%," in Proc. 27th Annu. IEEE Appl. Power Electron. Conf. Expo., Feb. 5-9, 2012, pp. 1536-1543.
-
(2012)
Proc. 27th Annu. IEEE Appl. Power Electron. Conf. Expo.
, pp. 1536-1543
-
-
Rabkowski, J.1
Peftitsis, D.2
Nee, H.-P.3
-
13
-
-
80052078726
-
Challenges regarding parallel-connection of SiC JFETs
-
Jeju, Korea, Jun.
-
D. Peftitsis, R. Baburske, J. Rabkowski, J. Lutz, G. Tolstoy, and H.-P. Nee, "Challenges regarding parallel-connection of SiC JFETs," in Proc. Int. Conf. Power Electron., Jeju, Korea, Jun. 2011.
-
(2011)
Proc. Int. Conf. Power Electron
-
-
Peftitsis, D.1
Baburske, R.2
Rabkowski, J.3
Lutz, J.4
Tolstoy, G.5
Nee, H.-P.6
-
14
-
-
84867808127
-
Challenges regarding parallel-connection of SiC JFETs
-
Mar.
-
D. Peftitsis, R. Baburske, J. Rabkowski, J. Lutz, G. Tolstoy, and H-P. Nee, "Challenges regarding parallel-connection of SiC JFETs," IEEE Trans. Power Electron., vol. 28, no. 3, pp. 1449-1463, Mar. 2013.
-
(2013)
IEEE Trans. Power Electron
, vol.28
, Issue.3
, pp. 1449-1463
-
-
Peftitsis, D.1
Baburske, R.2
Rabkowski, J.3
Lutz, J.4
Tolstoy, G.5
Nee, H.-P.6
-
15
-
-
84866787241
-
Experimental comparison of different gate-driver configurations for parallelconnection of normally-ON SiC JFETs
-
Harbin, China, Jun. 2-5
-
D. Peftitsis, J.-K. Lim, J. Rabkowski, G. Tolstoy, and H.-P. Nee, "Experimental comparison of different gate-driver configurations for parallelconnection of normally-ON SiC JFETs," in Proc. IEEE 7th Int. Power Electron. Motion Control Conf., Harbin, China, Jun. 2-5, 2012.
-
(2012)
Proc. IEEE 7th Int. Power Electron. Motion Control Conf.
-
-
Peftitsis, D.1
Lim, J.-K.2
Rabkowski, J.3
Tolstoy, G.4
Nee, H.-P.5
-
16
-
-
79955767125
-
Investigation on the parallel operation of discrete SiCBJTs and JFETs
-
Mar. 6-11
-
M. Chinthavali, N. Puqi, C. Yutian, and L. M. Tolbert, "Investigation on the parallel operation of discrete SiCBJTs and JFETs," in Proc. 26th Annu. IEEE Appl. Power Electron. Conf. Expo.,Mar. 6-11, 2011, pp. 1076-1083.
-
(2011)
Proc. 26th Annu. IEEE Appl. Power Electron. Conf. Expo.
, pp. 1076-1083
-
-
Chinthavali, M.1
Puqi, N.2
Yutian, C.3
Tolbert, L.M.4
-
17
-
-
84879401244
-
A 6 kW, 200 kHz boost converter with parallel-connected SiC bipolar transistors
-
presented at Mar. 17-21
-
J. Rabkowski, D. Peftitsis, M. Zdanowski, and H.-P. Nee, "A 6 kW, 200 kHz boost converter with parallel-connected SiC bipolar transistors," presented at Proc. IEEE 28th Annu. Appl. Power Electron. Conf. Expo., Mar. 17-21, 2013.
-
(2013)
Proc. IEEE 28th Annu. Appl. Power Electron. Conf. Expo.
-
-
Rabkowski, J.1
Peftitsis, D.2
Zdanowski, M.3
Nee, H.-P.4
-
18
-
-
84892092409
-
-
NewYork NY USA: Springer
-
J. Lutz, H. Schlangenotto, U. Scheuermann, and R. De Doncker, Semiconductor Power Devices: Physics, Characteristics, Reliability. NewYork, NY, USA: Springer, 2011.
-
(2011)
Semiconductor Power Devices: Physics Characteristics Reliability
-
-
Lutz, J.1
Schlangenotto, H.2
Scheuermann, U.3
De Doncker, R.4
-
19
-
-
0031620904
-
Progress in development of high power NPT-IGBT module
-
Jun. 3-6
-
S. Miyashita, S. Yoshiwatari, S. Kobayashi, and K. Sakurai, "Progress in development of high power NPT-IGBT module," in Proc. 10th Int. Symp. Power Semicond. Devices, Jun. 3-6, 1998, pp. 285-288.
-
(1998)
Proc. 10th Int. Symp. Power Semicond. Devices
, pp. 285-288
-
-
Miyashita, S.1
Yoshiwatari, S.2
Kobayashi, S.3
Sakurai, K.4
-
20
-
-
0032310013
-
Further improvements in the reliability of IGBT modules
-
Oct. 12-15
-
T. Schutze, H. Berg, and M. Hierholzer, "Further improvements in the reliability of IGBT modules," in Proc. IEEE Ind. Appl. Conf., Oct. 12-15, 1998, vol. 2, pp. 1022-1025.
-
(1998)
Proc. IEEE Ind. Appl. Conf.
, vol.2
, pp. 1022-1025
-
-
Schutze, T.1
Berg, H.2
Hierholzer, M.3
-
21
-
-
0032598934
-
Advanced high current, high reliable IGBT module with improvedmultichip structure
-
R. Saito, Y. Koike, A. Tanaka, T. Kushima, H. Shimizu, and S. Nonoyama, "Advanced high current, high reliable IGBT module with improvedmultichip structure," in Proc. 11th Int. Symp. Power Semicond. Devices, 1999, pp. 109-112.
-
(1999)
Proc. 11th Int. Symp. Power Semicond. Devices
, pp. 109-112
-
-
Saito, R.1
Koike, Y.2
Tanaka, A.3
Kushima, T.4
Shimizu, H.5
Nonoyama, S.6
-
22
-
-
78650346450
-
IGBT module characterization, modeling and parasitic extraction
-
Sep. 17-19
-
A. Mulay and K. Shenai, "IGBT module characterization, modeling and parasitic extraction," in Proc. IEEE Int. Workshop Integr. Power Packag., Sep. 17-19, 1998, pp. 62-65.
-
(1998)
Proc. IEEE Int. Workshop Integr. Power Packag.
, pp. 62-65
-
-
Mulay, A.1
Shenai, K.2
-
23
-
-
0027262873
-
-
Proc Int Symp Power Semicond Devices ICs
-
T. Tsunoda, T. Matsuda, Y. Nakadaira, H. Nakayama, and Y. Sasada, "Low-inductance module construction for high speed, high-current IGBT module suitable for electric vehicle application," in Proc. 5th Int. Symp. Power Semicond. Devices, May 18-20, 1993, pp. 292-295. (Pubitemid 23704347)
-
(1993)
Low-inductance module construction for high speed, high current IGBT module suitable for electric vehicle application
, pp. 292-295
-
-
Tsunoda Tetsujiro1
Matsuda Tadashi2
Nakadaira Yoshikuni3
Nakayama Hirofumi4
Sasada Yorimichi5
-
24
-
-
0242676245
-
High speed IGBT module transient thermal response measurements for model validation
-
Oct. 12-16
-
D. Berning, J. Reichl, A. Hefner, M. Hernandez, C. Ellenwood, and J. S. Lai, "High speed IGBT module transient thermal response measurements for model validation," in Proc. 38th IAS Annu. Meeting. Conf. Rec. Ind. Appl. Conf., Oct. 12-16, 2003, vol. 3, pp. 1826-1832.
-
(2003)
Proc. 38th IAS Annu. Meeting. Conf. Rec. Ind. Appl. Conf.
, vol.3
, pp. 1826-1832
-
-
Berning, D.1
Reichl, J.2
Hefner, A.3
Hernandez, M.4
Ellenwood, C.5
Lai, J.S.6
-
26
-
-
0036444586
-
Investigation of gate voltage oscillations in an IGBT module under short circuit conditions
-
T. Ohi, A. Iwata, and K. Arai, "Investigation of gate voltage oscillations in an IGBT module under short circuit conditions," in Proc. IEEE 33rd Annu. Power Electron. Spec. Conf., 2002, pp. 1758-1763. (Pubitemid 35411303)
-
(2002)
PESC Record - IEEE Annual Power Electronics Specialists Conference
, vol.4
, pp. 1758-1763
-
-
Ohi, T.1
Iwata, A.2
Arai, K.3
-
27
-
-
0037644857
-
Circuit analysis of active mode parasitic oscillations in IGBT modules
-
Apr.
-
P. R. Palmer and J. C. Joyce, "Circuit analysis of active mode parasitic oscillations in IGBT modules," Proc. IEE Circuits, Devices Syst., vol. 150, no. 2, pp. 85-91, Apr. 2003.
-
(2003)
Proc. IEE Circuits, Devices Syst.
, vol.150
, Issue.2
, pp. 85-91
-
-
Palmer, P.R.1
Joyce, J.C.2
-
29
-
-
80053545766
-
A 6-in-1 IGBT module performance evaluation platform determining the trade-off between dV/dt and turn-on loss of different IGBT/FwDi chip setups
-
Aug. 30, 2011, Sep. 1
-
M. Honsberg, T. Radke,K. Ishii, and J.Manotobu, "A 6-in-1 IGBT module performance evaluation platform determining the trade-off between dV/dt and turn-on loss of different IGBT/FwDi chip setups," in Proc. 14th Eur. Conf. Power Electron. Appl., Aug. 30, 2011, Sep. 1, 2011, pp. 1-7.
-
(2011)
Proc. 14th Eur. Conf. Power Electron. Appl.
, pp. 1-7
-
-
Honsberg, M.1
Radke, T.2
Ishii, K.3
Manotobu, J.4
-
30
-
-
84874155183
-
Newmodule concept for overall low inductance
-
presented at Nuremberg, Germany, May 8-10
-
D. Domes, R. Bayerer, andA.Herbrandt, "Newmodule concept for overall low inductance," presented at PCIM Europe, Nuremberg, Germany, May 8-10, 2012.
-
(2012)
PCIM Europe
-
-
Domes, D.1
Bayerer, R.2
Herbrandt, A.3
-
31
-
-
81855217441
-
Design comparison of high power medium-voltage converters based on 6.5kV Si-IGBT/Si-PiN diode, 6.5kV Si-IGBT/SiC-JBS diode, and 10kV SiC MOSFET/SiC-JBS diode
-
Sep. 17-22
-
H. Mirzaee, De Ankan, A. Tripathi, and S. Bhattacharya, "Design comparison of high power medium-voltage converters based on 6.5kV Si-IGBT/Si-PiN diode, 6.5kV Si-IGBT/SiC-JBS diode, and 10kV SiC MOSFET/SiC-JBS diode," in IEEE Energy Convers. Congr. Expo., Sep. 17-22, 2011, pp. 2421-2428.
-
(2011)
IEEE Energy Convers. Congr. Expo.
, pp. 2421-2428
-
-
De Ankan, H.M.1
Tripathi, A.2
Bhattacharya, S.3
-
32
-
-
79955752836
-
P-cell and N-cell based IGBTmodule: Layout design, parasitic extraction, and experimental verification
-
Mar. 6-11
-
Li Shengnan, L. M. Tolbert, F. Wang, and F. Z. Peng, "P-cell and N-cell based IGBTmodule: Layout design, parasitic extraction, and experimental verification," in Proc. 26th Annu. IEEE Appl. Power Electron. Conf. Expo., Mar. 6-11, 2011, pp. 372-378.
-
(2011)
Proc. 26th Annu.IEEE Appl. Power Electron. Conf. Expo.
, pp. 372-378
-
-
Shengnan, L.1
Tolbert, L.M.2
Wang, F.3
Peng, F.Z.4
-
33
-
-
83355171628
-
Parasitics consideration of layout design within IGBT module
-
Aug. 20-23
-
P. Zhang, X.Wen, andY. Zhong, "Parasitics consideration of layout design within IGBT module," in Proc. Int. Conf. Elect. Machines Syst., Aug. 20-23, 2011, pp. 1-4.
-
(2011)
Proc. Int. Conf. Elect. Machines Syst.
, pp. 1-4
-
-
Zhang, P.1
Wen, X.2
Zhong, Y.3
-
34
-
-
84875168748
-
Stability considerations for silicon carbide field effect transistors
-
Oct.
-
A. Lemmon, M. Mazzola, J. Gafford, and C. Parker, "Stability considerations for silicon carbide field effect transistors," IEEE Trans. Power Electron., vol. 28, no. 10, pp. 4453-4459, Oct. 2013.
-
(2013)
IEEE Trans. Power Electron
, vol.28
, Issue.10
, pp. 4453-4459
-
-
Lemmon, A.1
Mazzola, M.2
Gafford, J.3
Parker, C.4
-
35
-
-
84867796658
-
Development of a SiC JFET-based six-pack power module for a fully integrated inverter
-
Mar.
-
F. Xu, T. J.Han,D. Jiang, L. M. Tolbert, F.Wang, J. Nagashima, S. J. Kim, S. Kulkarni, and F. Barlow, "Development of a SiC JFET-based six-pack power module for a fully integrated inverter," IEEE Trans. Power Electron., vol. 28, no. 3, pp. 1464-1478, Mar. 2013.
-
(2013)
IEEE Trans. Power Electron
, vol.28
, Issue.3
, pp. 1464-1478
-
-
Xu, F.1
Han, T.J.2
Jiang, D.3
Tolbert, L.M.4
Wang, F.5
Nagashima, J.6
Kim, S.J.7
Kulkarni, S.8
Barlow, F.9
-
36
-
-
77952200634
-
18 kW three phase inverter system using hermetically sealed SiC phaseleg power modules
-
Feb. 21-25
-
H. Zhang, L. M. Tolbert, J. H. Han, M. S. Chinthavali, and F. Barlow, "18 kW three phase inverter system using hermetically sealed SiC phaseleg power modules," in Proc. 25th Annu. IEEE Appl. Power Electron. Conf. Expo., Feb. 21-25, 2010, pp. 1108-1112.
-
(2010)
Proc. 25th Annu. IEEE Appl. Power Electron. Conf. Expo.
, pp. 1108-1112
-
-
Zhang, H.1
Tolbert, L.M.2
Han, J.H.3
Chinthavali, M.S.4
Barlow, F.5
-
37
-
-
80052100930
-
High temperature packaging of 50 kW three-phase SiC power module
-
May 30, 2011-Jun. 3
-
F. Xu, D. Jiang, J.Wang, F.Wang, L. M. Tolbert, T. J. Han, J. Nagashima, and S. J. Kim, "High temperature packaging of 50 kW three-phase SiC power module," in Proc. IEEE 8th Int. Conf. Power Electron. ECCE Asia, May 30, 2011-Jun. 3, 2011, pp. 2427-2433.
-
(2011)
Proc. IEEE 8th Int. Conf. Power Electron. ECCE Asia
, pp. 2427-2433
-
-
Xu, F.1
Jiang, D.2
Wang, J.3
Wang, F.4
Tolbert, L.M.5
Han, T.J.6
Nagashima, J.7
Kim, S.J.8
-
38
-
-
81855206653
-
Characterization of a high temperature multichip SiC JFET-based module
-
Sep. 17-22
-
F. Xu, D. Jiang, J.Wang, F.Wang, L. M. Tolbert, T. J. Han, and S. J. Kim, "Characterization of a high temperature multichip SiC JFET-based module," in Proc. IEEE Energy Convers. Congr. Expo., Sep. 17-22, 2011, pp. 2405-2412.
-
(2011)
Proc. IEEE Energy Convers. Congr. Expo.
, pp. 2405-2412
-
-
Xu, F.1
Jiang, D.2
Wang, J.3
Wang, F.4
Tolbert, L.M.5
Han, T.J.6
Kim, S.J.7
-
39
-
-
84860184738
-
Design steps towards a 40-kVA SiC inverter with an efficiency exceeding 99.5%
-
Feb. 5-9
-
J. Rabkowski, D. Peftitsis, and H.-P. Nee, "Design steps towards a 40-kVA SiC inverter with an efficiency exceeding 99.5%," in Proc. 27th Annu. IEEE Appl. Power Electron. Conf. Expo., Feb. 5-9, 2012, pp. 1536-1543.
-
(2012)
Proc. 27th Annu. IEEE Appl. Power Electron. Conf. Expo.
, pp. 1536-1543
-
-
Rabkowski, J.1
Peftitsis, D.2
Nee, H.-P.3
-
40
-
-
84893102354
-
Modeling of the impact of parameter spread on the switching performance of parallel-connected SiC VJFETs
-
presented at St. Petersburg, Russia, Sep. 2-6
-
J.-K. Lim, D. Peftitsis, J. Rabkowski,M. Bakowski, and H.-P. Nee, "Modeling of the impact of parameter spread on the switching performance of parallel-connected SiC VJFETs," presented at 9th Eur. Conf. Silicon Carbide Related Mater., St. Petersburg, Russia, Sep. 2-6, 2012.
-
(2012)
9th Eur. Conf. Silicon Carbide Related Mater
-
-
Lim, J.-K.1
Peftitsis, D.2
Rabkowski, J.3
Bakowski, M.4
Nee, H.-P.5
-
41
-
-
79955106312
-
A comparison of 1200 v normally-off & normally-on vertical trench SiC power JFET devices
-
Mar.
-
J. B. Casady, D. C. Sheridan, R. L. Kelley, V. Bondarenko, and A. Ritenour, "A comparison of 1200 V normally-off & normally-on vertical trench SiC power JFET devices," Mater. Sci. Forum, vol. 679-680, pp. 641-644, Mar. 2010.
-
(2010)
Mater. Sci. Forum
, vol.679-680
, pp. 641-644
-
-
Casady, J.B.1
Sheridan, D.C.2
Kelley, R.L.3
Bondarenko, V.4
Ritenour, A.5
-
42
-
-
81855177249
-
Experimental study of power module with SiC devices
-
Sep. 17-22
-
D. Jiang, F. Xu, F. Wang, L. M. Tolbert, T. J. Han, and S. J. Kim, "Experimental study of power module with SiC devices," in Proc. IEEE Energy Conver. Congr. Expo., Sep. 17-22, 2011, pp. 3894-3899.
-
(2011)
Proc. IEEE Energy Conver. Congr. Expo.
, pp. 3894-3899
-
-
Jiang, D.1
Xu, F.2
Wang, F.3
Tolbert, L.M.4
Han, T.J.5
Kim, S.J.6
-
43
-
-
77956547372
-
High power SiC modules for HEVs and PHEVs
-
Jun. 21-24
-
M. Chinthavali, L. M. Tolbert, H. Zhang, J. H. Han, F. Barlow, and B. Ozpineci, "High power SiC modules for HEVs and PHEVs," in Proc. Int. Power Electron. Conf., Jun. 21-24, 2010, pp. 1842-1848.
-
(2010)
Proc. Int. Power Electron. Conf.
, pp. 1842-1848
-
-
Chinthavali, M.1
Tolbert, L.M.2
Zhang, H.3
Han, J.H.4
Barlow, F.5
Ozpineci, B.6
-
44
-
-
0035058370
-
The effect of circuit parasitic impedance on the performance of IGBTs in voltage source inverters
-
C. Winterhalter, R. Kerkman, D. Schlegel, and D. Leggate, "The effect of circuit parasitic impedance on the performance of IGBTs in voltage source inverters," in Proc. 16th Annu. IEEE Appl. Power Electron. Conf. Expo., 2001, vol. 2, pp. 995-1001. (Pubitemid 32327310)
-
(2001)
Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
, vol.2
, pp. 995-1001
-
-
Winterhalter, C.1
Kerkman, R.2
Schlegel, D.3
Leggate, D.4
-
45
-
-
84867813071
-
Monitoring potential defects in an IGBT module based on dynamic changes of the gate current
-
Mar.
-
S. Zhou, L. Zhou, and P. Sun, "Monitoring potential defects in an IGBT module based on dynamic changes of the gate current," IEEE Trans. Power Electron., vol. 28, no. 3, pp. 1479-1487, Mar. 2013.
-
(2013)
IEEE Trans. Power Electron
, vol.28
, Issue.3
, pp. 1479-1487
-
-
Zhou, S.1
Zhou, L.2
Sun, P.3
-
46
-
-
78650156400
-
-
M.S. thesis,Virginia Polytechnic Institute, Dept. Elect. Comput. Eng., Blacksburg, VA, USA
-
Z. Chen, "Characterization and modeling of high-switching-speed behavior of SiC active devices," M.S. thesis,Virginia Polytechnic Institute, Dept. Elect. Comput. Eng., Blacksburg, VA, USA, 2009.
-
(2009)
Characterization and Modeling of High-switching-speed Behavior of SiC Active Devices
-
-
Chen, Z.1
-
47
-
-
84876741003
-
High-temperature characterization of a 1200 V, 450 A power module with 36 mm2 of SiC VJFET area
-
May 8-10
-
K. Speer, R. Schrader, D. Sheridan, A. Lemmon, J. Gafford, C. Parker, M. Mazzola, and J. Casady, "High-temperature characterization of a 1200 V, 450 A power module with 36 mm2 of SiC VJFET area," in Proc. Int. Conf. High Temperature Electron., May 8-10, 2012.
-
(2012)
Proc. Int. Conf. High Temperature Electron
-
-
Speer, K.1
Schrader, R.2
Sheridan, D.3
Lemmon, A.4
Gafford, J.5
Parker, C.6
Mazzola, M.7
Casady, J.8
-
49
-
-
84860657984
-
An optimized driver for SiC JFET-based switches delivering more than 99% efficiency
-
Feb. 19-23
-
K. Norling, C. Lindholm, and D. Draxelmayr, "An optimized driver for SiC JFET-based switches delivering more than 99% efficiency," in Proc. IEEE Int. Solid-State Circuits Conf. Digest Tech. Papers, Feb. 19-23, 2012, pp. 284-286.
-
(2012)
Proc. IEEE Int. Solid-State Circuits Conf. Digest Tech. Papers
, pp. 284-286
-
-
Norling, K.1
Lindholm, C.2
Draxelmayr, D.3
-
50
-
-
80053531062
-
Ultrafast safety system to turn-off normally on SiC JFETs
-
F. Dubois, D. Bergogne, D. Risaletto, R. Perrin, A. Zaoui, H. Morel, and R Meuret, "Ultrafast safety system to turn-off normally on SiC JFETs," in Proc.14th Eur. Conf. Power Electron. Appl., 2011, pp. 1-10.
-
(2011)
Proc.14th Eur. Conf. Power Electron. Appl.
, pp. 1-10
-
-
Dubois, F.1
Bergogne, D.2
Risaletto, D.3
Perrin, R.4
Zaoui, A.5
Morel, H.6
Meuret, R.7
-
51
-
-
79953734338
-
Normally-on SiC JFETs in power converters: Gate driver and safe operation
-
Mar. 16-18
-
D. Bergogne, D. Risaletto, F. Dubois, A. Hammoud, H. Morel, P. Bevilacqua, B. Allard, O. Berry, F.Meibody-Tabar, S. Raeel, R. Meuret, S. Dhokkar, and Hispano-Suiza, "Normally-on SiC JFETs in power converters: Gate driver and safe operation," in Proc. 6th Int. Conf. Integr. Power Electron. Syst., Mar. 16-18, 2010, pp. 1-6.
-
(2010)
Proc. 6th Int. Conf. Integr. Power Electron. Syst.
, pp. 1-6
-
-
Bergogne, D.1
Risaletto, D.2
Dubois, F.3
Hammoud, A.4
Morel, H.5
Bevilacqua, P.6
Allard, B.7
Berry, O.8
Meibody-Tabar, F.9
Raeel, S.10
Meuret, R.11
Dhokkar, S.12
Hispano-Suiza13
-
52
-
-
79957558715
-
Gate driver for SiC JFETs with protection against normally-on behaviour induced fault
-
Mar.
-
F. Gúedon, S. K. Singh, R. A. McMahon, and F. Udrea, "Gate driver for SiC JFETs with protection against normally-on behaviour induced fault," Electron. Lett., vol. 47, no. 6, pp. 375-377, Mar. 2011.
-
(2011)
Electron. Lett.
, vol.47
, Issue.6
, pp. 375-377
-
-
Gúedon, F.1
Singh, S.K.2
McMahon, R.A.3
Udrea, F.4
-
53
-
-
78649351103
-
A shoot-through protection scheme for converters built with SiC JFETs
-
Nov./Dec.
-
L. Rixin, W. Fei, R. Burgos, D. Boroyevich, D. Zhang, and P. Ning, "A shoot-through protection scheme for converters built with SiC JFETs," IEEE Trans. Ind. Appl., vol. 46, no. 6, pp. 2495-2500, Nov./Dec. 2010.
-
(2010)
IEEE Trans. Ind. Appl.
, vol.46
, Issue.6
, pp. 2495-2500
-
-
Rixin, L.1
Fei, W.2
Burgos, R.3
Boroyevich, D.4
Zhang, D.5
Ning, P.6
-
54
-
-
77950133456
-
Protection circuit of normally-on SiC JFET using an inrush current
-
Oct. 18-22
-
J.-H. Kim, B.-D. Min, J.-W. Baek, and D.-W. Yoo, "Protection circuit of normally-on SiC JFET using an inrush current," in Proc. 31st Int. Telecommun. Energy Conf., Oct. 18-22, 2009, pp. 1-4.
-
(2009)
Proc. 31st Int. Telecommun. Energy Conf.
, pp. 1-4
-
-
Kim, J.-H.1
Min, B.-D.2
Baek, J.-W.3
Yoo, D.-W.4
-
55
-
-
84867799218
-
Self-powered gate driver for normally on silicon carbide junction field-effect transistors without external power supply
-
Mar.
-
D. Peftitsis, J. Rabkowski, and H-PNee, "Self-powered gate driver for normally on silicon carbide junction field-effect transistors without external power supply," IEEE Trans. Power Electron., vol. 28, no. 3, pp. 1488-1501, Mar. 2013.
-
(2013)
IEEE Trans. Power Electron
, vol.28
, Issue.3
, pp. 1488-1501
-
-
Peftitsis, D.1
Rabkowski, J.2
Nee, H.-P.3
-
56
-
-
84859762860
-
Novel AC coupled gate driver for ultra fast switching of normally-off SiC JFETs
-
Jul.
-
B. Wrzecionko, S. Kach, D. Bortis, J. Biela, and J. W. Kolar, "Novel AC coupled gate driver for ultra fast switching of normally-off SiC JFETs," IEEE Trans. Power Electron., vol. 27, no. 7, pp. 3452-3463, Jul. 2012.
-
(2012)
IEEE Trans. Power Electron
, vol.27
, Issue.7
, pp. 3452-3463
-
-
Wrzecionko, B.1
Kach, S.2
Bortis, D.3
Biela, J.4
Kolar, J.W.5
-
57
-
-
79955106312
-
A comparison of 1200 v normally-off & normally-on vertical trench SiC power JFET devices
-
Mar.
-
J. B. Casady, D. C. Sheridan, R. Kelley, V. Bondarenko, and A. Ritenour, "A comparison of 1200 V normally-off & normally-on vertical trench SiC power JFET devices," Mater. Sci. Forum, vol. 679-680, pp. 641-644, Mar. 2011.
-
(2011)
Mater. Sci. Forum
, vol.679-680
, pp. 641-644
-
-
Casady, J.B.1
Sheridan, D.C.2
Kelley, R.3
Bondarenko, V.4
Ritenour, A.5
|