Further improvements in the reliability of IGBT modules

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Volumn 2, Issue , 1998, Pages 1022-1025

  Schuetze, Thomas ^a   Berg, Hermann ^a   Hierholzer, Martin ^a  

^a Eupec GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

POWER ELECTRONICS; RELIABILITY;

INSULATED GATED BIPOLAR TRANSISTORS (IGBT);

BIPOLAR TRANSISTORS;

EID: 0032310013     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)