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Volumn 47, Issue 6, 2011, Pages 375-377

Gate driver for SiC JFETs with protection against normally-on behaviour induced fault

Author keywords

[No Author keywords available]

Indexed keywords

GATE DRIVERS; JUNCTION FIELD-EFFECT TRANSISTORS;

EID: 79957558715     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el.2011.0241     Document Type: Article
Times cited : (18)

References (7)
  • 6
    • 77950868970 scopus 로고    scopus 로고
    • Comparative switching behaviour of silicon transistors and practical silicon carbide transistors
    • 8th, Taipei, Taiwan, November
    • Singh, S.K., Guedon, F., and McMahon, R.:'Comparative switching behaviour of silicon transistors and practical silicon carbide transistors', 8th, Int. Conf. on Power Electronics and Drive Systems, (PEDS 2009), Taipei, Taiwan, November, 2009, p. 585-590
    • (2009) Int. Conf. on Power Electronics and Drive Systems, (PEDS 2009) , pp. 585-590
    • Singh, S.K.1    Guedon, F.2    McMahon, R.3
  • 7
    • 42449101717 scopus 로고    scopus 로고
    • A new, universal and fast switching gate-drive-concept for SiC-JFETs based on current source principle
    • 37th, Jeju, Republic of Korea, June
    • Domes, D., Werner, R., Hofmann, W., Domes, K., and Krauß, S.:'A new, universal and fast switching gate-drive-concept for SiC-JFETs based on current source principle', 37th, IEEE Power Electronics Specialists Conf., Jeju, Republic of Korea, June, 2006, p. 1-6
    • (2006) IEEE Power Electronics Specialists Conf. , pp. 1-6
    • Domes, D.1    Werner, R.2    Hofmann, W.3    Domes, K.4    Krauß, S.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.