IGBT module characterization, modeling and parasitic extraction

IWIPP 1998 Proceedings - IEEE International Workshop on Integrated Power Packaging

Volumn , Issue , 1998, Pages 62-65

  Mulay, Amit ^a   Shenai, Krishna ^a  

^a University of Illinois at Chicago   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INSULATED GATE BIPOLAR TRANSISTORS (IGBT); PACKAGING;

ACCURATE PREDICTION; ANTI-PARALLEL DIODES; HIGH POWER-HIGH FREQUENCY; OPERATING CONDITION; PACKAGE PARASITICS; PARASITIC ELEMENT; PARASITIC EXTRACTION; POWER ELECTRONIC SYSTEMS;

ELECTRIC LOSSES;

EID: 78650346450     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IWIPP.1998.722308     Document Type: Conference Paper

References (6)

1. Sameer Pendharkar, Malay Trivedi and Krishna Shenai, "Dynamics of Reverse Recovery of High Power P-i-N Diodes", in IEEE Tran. on Electron Devices-Jan'96, pp. 142-149.
2. J. Sigg, P. Turkes, R. Kraus, "Parameter Extraction Methodology and Validation for an Electrothermal Physics-Based NFT IGBT model", in Proc. of Industry Application Society (IAS)-97 conference record, pp. 1166-1173.
3. B. Fatemizadeh and G. Tchouangue, D. Silber, "A Useroptimized Electro-thermal Model for Power Electronic Circuit Simulation in the Circuit Simulator ELDO", in Proc. of Applied Power Electronics Conference and exposition (APEC)-96 conference record, pp 81-87.
4. Kun Xing, Fred C. Lee, and Dushan Boroyevich, "Extraction of Parasitics within Wire-Bond IGBT Modules", in Proc. of Applied Power Electronics Conference and exposition (APEC)-98 conference record, pp 497-503.
5. M. Trivedi and K. Shenai, "Modeling the Turn - Off of IGBTs in Hard - and Soft - Switching Applications", IEEE Trans. Electron Devices, Vol. 44, No. 5, pp. 887-893, May 1997
6. Malay Trivedi, K. Shenai and Erik Larson, "Critical evaluation of IGBT performance in Zero Current Switching Environment", in Proc. of Industry Application Society (IAS)-97 conference record, pp. 989-992