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Volumn 150, Issue 2, 2003, Pages 85-91

Circuit analysis of active mode parasitic oscillations in IGBT modules

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CIRCUIT OSCILLATIONS; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; GATES (TRANSISTOR); INDUCTANCE; RESISTORS; TRANSCONDUCTANCE; TRANSIENTS;

EID: 0037644857     PISSN: 13502409     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-cds:20030336     Document Type: Review
Times cited : (24)

References (21)
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  • 2
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    • Parallel oepration of the insulated gate transistor in switching operations
    • June
    • KORN, S.R.: 'Parallel oepration of the insulated gate transistor in switching operations'. Proceedings of Power Conversion International Conference, June 1986, pp. 218-234
    • (1986) Proceedings of Power Conversion International Conference , pp. 218-234
    • Korn, S.R.1
  • 3
    • 85046125677 scopus 로고    scopus 로고
    • Causes of parasitic current oscillation in IGBT modules during turn-off
    • Lausanne, Switzerland, Sept. paper 376
    • PALMER, P.R., and JOYCE, J.C.: 'Causes of parasitic current oscillation in IGBT modules during turn-off. Presented at 8th European Conference on Power electronics and applications, Lausanne, Switzerland, Sept. 1999, paper 376
    • (1999) 8th European Conference on Power Electronics and Applications
    • Palmer, P.R.1    Joyce, J.C.2
  • 5
    • 0026835179 scopus 로고
    • Static and dynamic behaviour of paralleled IGBTs
    • LETOR, R.: 'Static and dynamic behaviour of paralleled IGBTs', IEEE Trans. Ind. Appl., 1992, 28, (2), pp. 395-402
    • (1992) IEEE Trans. Ind. Appl. , vol.28 , Issue.2 , pp. 395-402
    • Letor, R.1
  • 6
    • 29144505545 scopus 로고
    • An analytical model for the steady state and transient characteristics of the power insulated-gate bipolar transistor
    • HEFNER, A., and BLACKBURN, D.L.: 'An analytical model for the steady state and transient characteristics of the power insulated-gate bipolar transistor', Solid-State Electron., 1988, 31, (10), pp. 1513-1532
    • (1988) Solid-State Electron. , vol.31 , Issue.10 , pp. 1513-1532
    • Hefner, A.1    Blackburn, D.L.2
  • 7
    • 0025497993 scopus 로고
    • An improved understanding of the transient operation of the power insulted gate bipolar transistor (IGBT)
    • HEFNER, A.R.: 'An improved understanding of the transient operation of the power insulted gate bipolar transistor (IGBT)', IEEE Trans. Power Electron., 1990, 5, (4), pp. 459-468
    • (1990) IEEE Trans. Power Electron. , vol.5 , Issue.4 , pp. 459-468
    • Hefner, A.R.1
  • 9
    • 0032182614 scopus 로고    scopus 로고
    • An analysis of the series connection of IGBTs
    • GITHIARI, A.N., and PALMER, P.R.: 'An analysis of the series connection of IGBTs', IEE Proc., Circuits Devices Syst., 1998,145, (5), pp. 354-360
    • (1998) IEE Proc., Circuits Devices Syst. , vol.145 , Issue.5 , pp. 354-360
    • Githiari, A.N.1    Palmer, P.R.2
  • 10
    • 0038160167 scopus 로고    scopus 로고
    • Version 6
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    • (1999)
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  • 12
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    • ATLAS
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    • Exact inductive parasitic extraction for analysis of IGBT parallel switching including DCB-backside eddy currents
    • Galway, June
    • GUTSMANN, B., MOURICK, P., and SILBER, D.: 'Exact inductive parasitic extraction for analysis of IGBT parallel switching including DCB-backside eddy currents'. Proceedings of IEEE Power Electronics Specialists Conference, Galway, June 2000, pp. 1291-1295
    • (2000) Proceedings of IEEE Power Electronics Specialists Conference , pp. 1291-1295
    • Gutsmann, B.1    Mourick, P.2    Silber, D.3
  • 19
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    • Influence of stray inductances on current sharing during switching transistions in paralleled semiconductors
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    • (1999) Presented at European Power Electronics Conference
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  • 21
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    • Gutsmann, B.1    Silber, D.2    Mourick, P.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.