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Volumn , Issue , 2011, Pages

The 1200V direct-driven SiC JFET power switch

Author keywords

device simulation; IGBT; JFET; SiC; switching losses

Indexed keywords

DEVICE SIMULATIONS; DIRECT-DRIVEN; EXCELLENT PERFORMANCE; HIGH THERMAL CONDUCTIVITY; LOW LOSS; LOW-VOLTAGE; POWER DEVICES; POWER SWITCHES; SIC; SILICON CARBIDE SCHOTTKY DIODES; SILICON MOSFET; SWITCHING LOSSES; TEMPERATURE CAPABILITY; WIDE BAND GAP; WIDE-BAND-GAP SEMICONDUCTOR;

EID: 80053506114     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (34)

References (17)
  • 1
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    • State-of-the-art and Future of Wide Band-gap devices
    • Kaminski N.: State-of-the-art and Future of Wide Band-gap devices, Proc. EPE (Barcelona 2009)
    • Proc. EPE (Barcelona 2009)
    • Kaminski, N.1
  • 3
    • 84887441247 scopus 로고    scopus 로고
    • Status of SiC Power Devices and Manufacturing Issues
    • Vancouver
    • Agarwal A. and Ryu S.-H.: Status of SiC Power Devices and Manufacturing Issues, Proc. CS MANTECH Conference, pp. 215-218, Vancouver, 2006,
    • (2006) Proc. CS MANTECH Conference , pp. 215-218
    • Agarwal, A.1    Ryu, S.-H.2
  • 7
    • 0242580955 scopus 로고    scopus 로고
    • Degradation in SiC bipolar devices: Source and consequence of electrically active dislocations in SiC
    • Lendenmann H., Bergmann J.P., Dahlquist F. and Hallin C.: Degradation in SiC bipolar devices: source and consequence of electrically active dislocations in SiC, Proc. Materials Science Forum, Vol. 433-436, pp.901-906, 2003
    • (2003) Proc. Materials Science Forum , vol.433-436 , pp. 901-906
    • Lendenmann, H.1    Bergmann, J.P.2    Dahlquist, F.3    Hallin, C.4
  • 8
    • 77957906823 scopus 로고    scopus 로고
    • Reliability of SiC Power Devices and its Influence on their Commercialization - Review, Status and Remaining Issues
    • Treu M., Rupp R. and Sölkner G.: Reliability of SiC Power Devices and its Influence on their Commercialization - Review, Status and Remaining Issues, Proc. IRPS, Anaheim, 2010
    • Proc. IRPS, Anaheim, 2010
    • Treu, M.1    Rupp, R.2    Sölkner, G.3
  • 11
    • 80053503509 scopus 로고
    • Composite Circuit for Power Semiconductor Switching
    • European Patent EP 0 063 749 B1
    • Baliga, B.J. and Adler, M.S.: Composite Circuit for Power Semiconductor Switching. European Patent EP 0 063 749 B1, 1982
    • (1982)
    • Baliga, B.J.1    Adler, M.S.2
  • 13
    • 84857365638 scopus 로고    scopus 로고
    • CASCODE LIGHT - Normally-on JFET stand alone performance in a normally-off Cascode circuit
    • Domes, D. and Zhang, Xi.: CASCODE LIGHT - normally-on JFET stand alone performance in a normally-off Cascode circuit. Proc. PCIM, Nuernberg 2010
    • Proc. PCIM, Nuernberg 2010
    • Domes, D.1    Zhang, X.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.