Transmission electron microscope as an ultimate tool for nanomaterial property studies

Journal of Electron Microscopy

Volumn 62, Issue 1, 2013, Pages 157-175

  Kawamoto, Naoyuki ^a   Tang, Dai Ming ^a   Wei, Xianlong ^a   Wang, Xi ^a   Mitome, Masanori ^a   Bando, Yoshio ^a   Golberg, Dmitri ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Electrical measurement; Graphene; In situ TEM observation; Lithiation; Si nanowire; Temperature measurement

Indexed keywords

LITHIUM-ION BATTERIES; NANOSTRUCTURED MATERIALS; NANOWIRES; TEMPERATURE MEASUREMENT; YARN;

ELECTRICAL MEASUREMENT; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPES; IN SITU TEM OBSERVATION; IN-SITU TEM; LITHIATION; POLEPIECES; PROPERTY; SI NANOWIRE; TEM OBSERVATIONS; TRANSMISSION ELECTRON;

GRAPHENE;

EID: 84876975874     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfs078     Document Type: Review

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