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Volumn 9, Issue 2, 2009, Pages 525-529

Size effects in mechanical deformation and fracture of cantilevered silicon nanowires

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; FRACTURE; NANOWIRES; SILICON; WIRE;

EID: 65249110987     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl802556d     Document Type: Article
Times cited : (174)

References (26)
  • 19
    • 85184355828 scopus 로고    scopus 로고
    • Sio2, as mentioned in the text. C varies from 7.2% for the smallest wires (110 nm) to 1.1% for the largest wires (700 nm) tested. See eqs 2and 5.
    • 2, as mentioned in the text. C varies from 7.2% for the smallest wires (110 nm) to 1.1% for the largest wires (700 nm) tested. See eqs 2and 5.
  • 23
    • 85184366378 scopus 로고    scopus 로고
    • The coupled spring system of AFM cantilever and NW yields a simple result for the spring constant observed when the nanowire is bent: 1/k obs, 1/kwire, lktip. An F-d curve on the hard substrate gives ktip, f/ΔZpiezo, msubst, and the wire test gives kobs =f/ΔZwire, ΔZtip, f/ ΔZpiezo, msubst
    • subst.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.