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Volumn 22, Issue 48, 2011, Pages

Local temperature measurements on nanoscale materials using a movable nanothermocouple assembled in a transmission electron microscope

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE COMPOSITES; DOUBLE PROBE; ELECTRON BEAM INTENSITY; HIGH-PRECISION; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPES; LOCAL TEMPERATURE MEASUREMENTS; MEASURING TEMPERATURE; NANO SCALE; NANO-SCALE MATERIALS; NANOELECTRODE; PROBING TECHNIQUES; QUICK RESPONSE; RAPID TEMPERATURE; THERMAL RESOLUTION; THERMOELECTROMOTIVE FORCES; TRANSMISSION ELECTRON MICROSCOPE;

EID: 80855144789     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/48/485707     Document Type: Article
Times cited : (15)

References (36)
  • 11
    • 0342819025 scopus 로고
    • Iijima S 1991 Nature 354 56-8
    • (1991) Nature , vol.354 , Issue.6348 , pp. 56-58
    • Iijima, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.