Orthopedic treatment of multiwalled carbon nanotube probes

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 7 B, 2003, Pages 4866-4868

  Negishi, Hideki ^a   Ohashi, Masayuki ^a   Akita, Seiji ^a   Nakayama, Yoshikazu ^a  

^a Osaka Prefecture University   (Japan)

Author keywords

Carbon nanotube; Electrical breakdown; Orthopedic process; Scanning probe microscopy

Indexed keywords

ASPECT RATIO; ATOMIC FORCE MICROSCOPY; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC BREAKDOWN; PROBES; SCANNING ELECTRON MICROSCOPY; SILICON; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY;

MULTIWALLED CARBON NANOTUBE; ORTHOPEDIC PROCESS; SCANNING PROBE MICROSCOPY;

CARBON NANOTUBES;

EID: 0141792456     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.4866     Document Type: Article

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