Exploring nanomechanical behavior of silicon nanowires: AFM bending versus nanoindentation

Advanced Functional Materials

Volumn 21, Issue 2, 2011, Pages 279-286

  Kim, Yong Jae ^a   Son, Kwangsoo ^a   Choi, In Chul ^a   Choi, In Suk ^b   Park, Won Il ^a   Jang, Jae Il ^a  

^a Hanyang University   (South Korea)

^b Korea Institute of Science and Technology   (South Korea)

Author keywords

AFM bending; mechanical properties; nanoindentation; silicon nanowires; size effects

Indexed keywords

AFM; ANALYTICAL MODEL; FINITE ELEMENT SIMULATIONS; LINE TENSION; MECHANICAL BEHAVIOR; MECHANICAL CHARACTERIZATIONS; MECHANICAL PERFORMANCE; NANO-MECHANICAL BEHAVIORS; NANOMECHANICAL TESTS; PRIMARY OBJECTIVE; RESEARCH FIELDS; SILICON NANOWIRES; SIZE DEPENDENCY; SIZE EFFECTS; SYSTEMATIC INVESTIGATIONS; TESTING CONDITIONS; TESTING ENVIRONMENT; TESTING METHOD;

ATOMIC FORCE MICROSCOPY; BENDING TESTS; COMPUTER SIMULATION; MATHEMATICAL MODELS; MODELS; NANOINDENTATION; NANOWIRES;

MECHANICAL PROPERTIES;

EID: 78650693362     PISSN: 1616301X     EISSN: 16163028     Source Type: Journal    
DOI: 10.1002/adfm.201001471     Document Type: Article

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