High-speed multiresolution scanning probe microscopy based on Lissajous scan trajectories

Nanotechnology

Volumn 23, Issue 18, 2012, Pages

  Tuma, Tomas ^a,b   Lygeros, John ^b   Kartik, V ^a   Sebastian, Abu ^a   Pantazi, Angeliki ^a  

^a IBM RESEARCH ZURICH   (Switzerland)

^b ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

A-FRAMES; AFM; AFM IMAGING; ATOMIC FORCE MICROSCOPE (AFM); CONSTANT FREQUENCY; FEED-BACK LOOP; FREQUENCY SPECTRA; HARMONIC WAVE FORMS; HIGH SPEED SCANNING; HIGH-SPEED; IMAGING SPEED; LISSAJOUS; MEASUREMENT NOISE; MULTI-RESOLUTIONS; RESONANT MODE; TEMPORAL RESOLUTION;

ATOMIC FORCE MICROSCOPY; SCANNING;

TRAJECTORIES;

EID: 84860202957     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/23/18/185501     Document Type: Review

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