High-speed cycloid-scan atomic force microscopy

Nanotechnology

Volumn 21, Issue 36, 2010, Pages

  Yong, Y K ^a   Moheimani, S O R ^a   Petersen, I R ^b  

^a UNIVERSITY OF NEWCASTLE   (Australia)

^b UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPES; FAST AXIS; HIGH-SPEED; MECHANICAL BANDWIDTH; RASTER SCANS; SCAN PATTERNS; ZIG-ZAG;

ATOMIC FORCE MICROSCOPY;

SPEED;

EID: 77957827881     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/36/365503     Document Type: Article

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