Fast spiral-scan atomic force microscopy

Nanotechnology

Volumn 20, Issue 36, 2009, Pages

  Mahmood, I A ^a   Reza Moheimani, S O ^a  

^a UNIVERSITY OF NEWCASTLE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPES; CONTROL EFFORT; HIGH QUALITY IMAGES; INPUT SIGNAL; MECHANICAL RESONANCE; RASTER SCANS; SCANNING TECHNIQUES; SINGLE FREQUENCY; SLOWLY VARYING AMPLITUDES; SPIRAL PATTERN;

ATOMIC FORCE MICROSCOPY;

SCANNING;

ARTICLE; ATOMIC FORCE MICROSCOPY; IMAGE QUALITY; MICROSCOPE IMAGE; NANOTECHNOLOGY; PRIORITY JOURNAL; VIBRATION;

EID: 70349111518     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/36/365503     Document Type: Article

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