Optimal scan trajectories for high-speed scanning probe microscopy

Proceedings of the American Control Conference

Volumn , Issue , 2012, Pages 3791-3796

  Tuma, Tomas ^a   Lygeros, John ^b   Sebastian, Abu ^a   Pantazi, Angeliki ^a  

^a IBM RESEARCH ZURICH   (Switzerland)

^b ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FUNCTIONS; HYDROPHOBICITY; IMAGE RESOLUTION; OPTIMIZATION; SCANNING PROBE MICROSCOPY;

FREQUENCY CONTENTS; HIGH SPEED SCANNING; LISSAJOUS CURVES; MATHEMATICAL OPTIMIZATIONS; OBJECTIVE FUNCTIONS; SPATIAL RESOLUTION; SYSTEMATIC ANALYSIS; VORONOI TESSELLATIONS;

TRAJECTORIES;

EID: 84869396401     PISSN: 07431619     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/acc.2012.6315127     Document Type: Conference Paper

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