Analyzing the distribution of threshold voltage degradation in nanoscale transistors by using reaction-diffusion and percolation theory

Journal of Computational Electronics

Volumn 10, Issue 4, 2011, Pages 341-351

  Islam, Ahmad Ehteshamul ^a   Alam, Muhammad Ashraful ^b  

^a University of Illinois at Urbana Champaign   (United States)

^b PURDUE UNIVERSITY   (United States)

Author keywords

Exponential distribution; Interface defect statistics; Markov Chain Monte Carlo; Reaction diffusion model; Skew normal distribution; Threshold voltage degradation

Indexed keywords

EXPONENTIAL DISTRIBUTIONS; INTERFACE DEFECTS; MARKOV CHAIN; REACTION-DIFFUSION MODELS; SKEW-NORMAL DISTRIBUTION; THRESHOLD VOLTAGE DEGRADATION;

DEFECTS; DEGRADATION; DIFFUSION IN LIQUIDS; INTERFACES (MATERIALS); MARKOV PROCESSES; NANOTECHNOLOGY; NORMAL DISTRIBUTION; SOLVENTS; SPATIAL DISTRIBUTION; STATISTICS; TRANSISTORS;

THRESHOLD VOLTAGE;

EID: 84855924238     PISSN: 15698025     EISSN: 15728137     Source Type: Journal    
DOI: 10.1007/s10825-011-0369-4     Document Type: Article

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