Two independent components modeling for Negative Bias Temperature Instability

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2010, Pages 33-42

  Huard, Vincent ^a  

^a STMICROELECTRONICS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATION FACTORS; DATA SETS; FAST TRANSIENTS; FIXED CHARGES; HYDROGEN TRANSFER; IN-DEPTH ANALYSIS; INDEPENDENT COMPONENTS; INTERFACE TRAPS; MICROSCOPIC MECHANISMS; NEGATIVE BIAS TEMPERATURE INSTABILITY; NITRIDED; OXYGEN BRIDGE; PROCESS DEPENDENCE; TRAPPING/DETRAPPING;

HYDROGEN; NEGATIVE TEMPERATURE COEFFICIENT; OXYGEN; SILICA;

THERMODYNAMIC STABILITY;

EID: 77957895256     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2010.5488857     Document Type: Conference Paper

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