NBTI-Aware statistical circuit delay assessment

Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009

Volumn , Issue , 2009, Pages 13-18

  Vaidyanathan, Balaji ^a,b   Oates, Anthony S ^a   Xie, Yuan ^b   Wang, Yu ^c  

^a TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY   (Taiwan)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

^c TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

AGING EFFECTS; ANALYTICAL MODEL; CIRCUIT DELAY DISTRIBUTIONS; CIRCUIT DELAYS; DELAY SPREAD; MITIGATION TECHNIQUES; PMOS NBTI;

ELECTRIC NETWORK ANALYSIS; THERMODYNAMIC STABILITY;

NEGATIVE TEMPERATURE COEFFICIENT;

EID: 67649671613     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2009.4810263     Document Type: Conference Paper

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