Probing negative bias temperature instability using a continuum numerical framework: Physics to real world operation

Microelectronics Reliability

Volumn 47, Issue 6, 2007, Pages 863-872

  Chakravarthi, S ^a   Krishnan, A T ^a   Reddy, V ^a   Krishnan, S ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; FAILURE ANALYSIS; INTERFACES (MATERIALS); MATHEMATICAL MODELS; RELIABILITY THEORY; THERMODYNAMIC STABILITY;

CMOS RELIABILITY; INTERFACE STATE GENERATION; MOLECULAR HYDROGEN DEFECTS; NEGATIVE BIAS TEMPERATURE INSTABILITY (NBTI);

BIAS CURRENTS;

EID: 34247866451     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2006.10.008     Document Type: Article

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