Hard x-ray nano-beam characterization by ptychographic imaging

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8141, Issue , 2011, Pages

  Schroer, Christian G ^a   Hönig, Susanne ^a   Goldschmidt, Andy ^a   Hoppe, Robert ^a   Patommel, Jens ^a   Samberg, Dirk ^a   Schropp, Andreas ^a   Seiboth, Frank ^a   Stephan, Sandra ^a   Schöder, Sebastian ^b,c   Burghammer, Manfred ^b   Denecke, Melissa ^d   Wellenreuther, Gerd ^e   Falkenberg, Gerald ^e  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c SYNCHROTRON SOLEIL   (France)

^d KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^e DESY   (Germany)

Author keywords

Coherent x ray imaging; Hard x ray nano beam; Ptychography; X ray optics

Indexed keywords

COHERENT DIFFRACTION IMAGING; COHERENT X-RAYS; COMPLEX WAVES; CONVENTIONAL TECHNIQUES; HARD X RAY; INCOMPLETE INFORMATION; LATERAL SIZES; NANO-FOCUS; NANO-FOCUSING; PTYCHOGRAPHY; SHAPE AND SIZE; TEST OBJECT; WAVEFIELDS; X RAY BEAM; X RAY SCANNING;

COMPUTATIONAL METHODS; IMAGING TECHNIQUES; SCANNING; X RAY OPTICS;

X RAYS;

EID: 80054056896     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.893055     Document Type: Conference Paper

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